- Tytuł:
- Rapid Structure Perfection Diagnostics of GaAs Single Crystal by Diffraction of White X-Ray Radiation
- Autorzy:
-
Khrupa, V. I.
Grigoryev, D. O.
Skorokhod, M. Ya.
Datsenko, L. I.
Bąk-Misiuk, J. - Powiązania:
- https://bibliotekanauki.pl/articles/1931661.pdf
- Data publikacji:
- 1994-10
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
81.40.-z
61.70.-r - Opis:
- Sensitivity of X-ray integral reflectivity of GaAs single crystal to a degree of structure distortions was established to grow considerably in the Bragg diffraction case when the characteristic AgK_{α$\text{}_{1}}$ line is changed for more hard white radiation. In effect, the absorption length essentially exceeds the extinction length what results in enhancement of incoherent scattering. Measurements of X-ray integral reflectivity coordinate dependence by single crystal spectrometer permitted to determine the mean level of crystal lattice distortion as well as the degree of structure homogeneity of a sample with dislocations. The Debye-Waller static factor value was estimated from X-ray integral reflectivity magnitudes for the 800 reflection of white radiation.
- Źródło:
-
Acta Physica Polonica A; 1994, 86, 4; 591-596
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł