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    Wyświetlanie 1-9 z 9
    Tytuł:
    Nanostructured Thin Films β-Al-Mg Obtained Using PLD Technique
    Autorzy:
    Radziszewska, A.
    Kąc, S.
    Feuerbacher, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/1537943.pdf
    Data publikacji:
    2010-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.55.-a
    68.55.Nq
    81.15.-z
    52.38.Mf
    Opis:
    In this work, the pulsed laser deposition (PLD) technique was used to grow AlMg thin films from a $β-Mg_{2}Al_{3}$ target with nominal composition: 39.09 at.% Mg and 60.91 at.% Al. The paper presents the study of $β-Mg_{2}Al_{3}$ thin films deposited using the pulsed laser deposition technique. AlMg thin films were prepared on Si (400) substrates and deposited by means of using a QS-Nd:YAG laser (λ = 266, 355 nm). Samples were prepared with laser fluence (1.1 J/$cm^{2}$ and 1.6 J/$cm^{2}$) and at two different substrate (Si) temperatures (25°C and 200°C). The target possessed columnar structure and changes in chemical composition took place as a result of the influence of the laser irradiation. Investigations focused on structure and chemical composition showed that the films generally had nanocrystalline structure and that the quantity of Al and Mg varied in the films.
    Źródło:
    Acta Physica Polonica A; 2010, 117, 5; 799-802
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    X-ray Characterization of Films Formed by Pulsed Laser Deposition on Cold Substrates from YBaCuO Targets
    Autorzy:
    Pełka, J. B.
    Paszkowicz, W.
    Gierłowski, P.
    Lewandowski, S. J.
    Zieliński, M.
    Barbanera, S.
    Knapp, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/2030707.pdf
    Data publikacji:
    2002-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    52.38.Mf
    81.15.-z
    68.55.-a
    Opis:
    Grazing-incidence X-ray diffraction supplemented with atomic force microscopy and secondary ion mass spectroscopy were applied to the characterization of films deposited by laser ablation on cold substrates from YBaCuO targets and subsequently irradiated with additional laser pulses of lower energy density. Evolution of X-ray diffraction pattern was observed as a function of irradiation dose. For the as-deposited films the pattern was typical of the amorphized solids. For the films irradiated with doses higher than the threshold, the pattern was enriched with the diffraction peaks, whose general features, like peak positions, widths and relative intensities were almost independent of the dose. The size of the crystallites was deduced from the peak widths to be not smaller than 12-16 nm. Comparison of the pattern with patterns of known phases indicates that, apart of the amorphous component, a structure with an admixture of some new metastable or high temperature phase(s) is formed during the process of pulsed laser annealing. The atomic force microscopy observations revealed that the surface roughness shows a pronounced minimum at low irradiation doses. The secondary ion mass spectroscopy investigation confirms that the strongest chemical changes (increase in concentration of yttrium and copper) due to irradiation with higher doses are observed in the near-surface film material.
    Źródło:
    Acta Physica Polonica A; 2002, 101, 5; 787-794
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Determination of the Direction of the c-Axis of $L1_0$ FePt Thin Films with the MÖssbauer Spectroscopy
    Autorzy:
    Laenens, B.
    Almeida, F.
    Vantomme, A.
    Meersschaut, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/1814040.pdf
    Data publikacji:
    2007-12
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.05.Qr
    68.55.-a
    81.15.-z
    Opis:
    The continued growth of storage capacity requires new innovations in recording media and in particular, in magnetic nanostructures. FePt thin films in the $L1_0$-phase are interesting candidates for high-density magnetic recording media due to their large magnetocrystalline anisotropy. In the present work, we investigated the magnetic and structural properties of FePt thin films directly grown on MgO(110) with molecular beam epitaxy. The purpose was to gain insight in the correlation between the magnetization process and the morphology of the FePt thin films. We introduce conversion electron MÖssbauer spectroscopy to derive the direction of the easy magnetization axis with respect to the substrate. The results are compared to the characterization performed with high angle X-ray diffraction.
    Źródło:
    Acta Physica Polonica A; 2007, 112, 6; 1313-1318
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Garnet Single Crystal as Substrate Material for HTSC Films
    Autorzy:
    Mukhopadhyay, P.
    Powiązania:
    https://bibliotekanauki.pl/articles/1964306.pdf
    Data publikacji:
    1997-07
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.55.-a
    68.60.-p
    74.76.Bz
    81.15.-z
    Opis:
    The use of high temperature superconductor for device application has made the compatibility of the film and substrate an important issue. Garnets having reasonably low dielectric constant and low dielectric losses can be viable low cost substrate materials for the microwave devices. Garnet single crystals like Gd$\text{}_{3}$Ga$\text{}_{5}$O$\text{}_{12}$ (GGG), Y$\text{}_{3}$Ga$\text{}_{5}$O$\text{}_{12}$ (YGG), Y$\text{}_{3}$Al$\text{}_{5}$O$\text{}_{12}$ (YAG) etc. can be potential HTSC substrate materials for microwave devices. Properties of HTSC films on some of these garnet crystals are compared here.
    Źródło:
    Acta Physica Polonica A; 1997, 92, 1; 147-151
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Structural Characterization of $La_{1-x}Sr_xCoO_3$ Thin Films Deposited by Pulsed Electron Deposition Method
    Autorzy:
    Cieniek, Ł.
    Kopia, A.
    Cyza, A.
    Kowalski, K.
    Kusiński, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/1398370.pdf
    Data publikacji:
    2016-10
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    81.15.-z
    81.10.Bk
    81.07.Bc
    68.55.-a
    68.55.J-
    68.55.Nq
    68.37.-d
    Opis:
    The aim of the presented research was to investigate the influence of strontium dopant on the structure and composition of $La_{1-x}Sr_{x}CoO_3$ (x=0, 0.1, 0.2) perovskite thin films. Pure and Sr doped LaCoO₃ thin films were grown by pulsed electron deposition technique on crystalline epi-polished Si/MgO substrates. Numerous analytical techniques (scanning electron microscopy, atomic force microscopy, X-ray photoelectron spectroscopy, and X-ray diffraction) were applied to characterize their phase/chemical composition, structure and surface morphology. X-ray diffraction analysis showed the presence of pure LaCoO₃ perovskite phase in the undoped thin film. For Sr doped thin films $La_{0.8}Sr_{0.2}CoO_3$ (x=0.2), $La_{0.9}Sr_{0.1}CoO_3$ (x=0.1) small contents of La₂ O₃ and LaSrCoO₄ phases were noticed. The crystallite sizes, calculated from the Williamson-Hall plots, were about 18 nm for all analyzed films. According to scanning electron microscopy/atomic force microscopy observations, obtained thin films were free from defects and cracks. Atomic force microscopy (tapping mode) analysis revealed the differences in the shape and quantity of surface crystallites for all thin films as a result of Sr doping and different deposition parameters. Atomic force microscopy technique also allowed measurement of roughness parameters for analyzed samples. X-ray photoelectron spectroscopy analyses of chemical states of elements of thin films showed that their chemical state was stable across the film thickness and even at the interface with the MgO substrate. X-ray photoelectron spectroscopy analysis also allowed to evaluate chemical states and atomic concentration of La, Co, and Sr elements within cross-sections of deposited thin films.
    Źródło:
    Acta Physica Polonica A; 2016, 130, 4; 1121-1123
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Study of Structure Densification in $TiO_2$ Coatings Prepared by Magnetron Sputtering under Low Pressure of Oxygen Plasma Discharge
    Autorzy:
    Domaradzki, J.
    Kaczmarek, D.
    Prociow, E.
    Radzimski, Z.
    Powiązania:
    https://bibliotekanauki.pl/articles/1503889.pdf
    Data publikacji:
    2011-07
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    81.15.Cd
    81.15.-z
    68.55.-a
    81.15.Aa
    Opis:
    Current work presents results of studies on structural and optical properties of the $TiO_2$ thin films prepared by reactive magnetron sputtering. Oxide thin films were deposited from metallic targets using oxygen gas only instead of usually used mixture of Ar-$O_2$. Additionally, an increased amplitude of unipolar pulses powering the magnetron has been applied. It is shown that all prepared coatings were stoichiometric and by changing only the discharge voltage it is possible to influence the resulting structural phase and optical properties of prepared thin films. Depending on conditions of magnetron powering, $TiO_2$ thin films had either the anatase structure with refraction index n = 2.1 (λ = 500 nm) or a high temperature stable rutile structure with n = 2.52 (λ = 500 nm).
    Źródło:
    Acta Physica Polonica A; 2011, 120, 1; 49-52
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Influence of Ca Content on the Structure and Properties οf (Co,Ca)O Thin Films Deposited by PLD Technique
    Autorzy:
    Cieniek, L.
    Kac, S.
    Powiązania:
    https://bibliotekanauki.pl/articles/1537944.pdf
    Data publikacji:
    2010-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    81.15.Fg
    81.15.-z
    81.15.Aa
    68.55.-a
    68.60.Bs
    68.37.-d
    68.55.jd
    Opis:
    In this paper the results of investigations of pure and Ca-doped CoO thin films deposited by PLD technique are presented. The studies carried out for variable Ca content allowed to establish optimal conditions for good quality oxide films preparation. The microstructure, chemical/phase composition and morphology of obtained thin films were examined by means of diverse techniques (SEM, EDS, XPS and XRD). For estimation of deposited Ca-doped CoO films quality the nanohardness and scratch tests (adhesion) were performed. Obtained results confirm that using PLD technique it is possible to carry stoichiometric composition of (Co,Ca)O from target to single crystal substrate and allow to conclude that the calcium dopant concentration (chemical composition) influence on the morphology and measured properties of deposited (Co,Ca)O films.
    Źródło:
    Acta Physica Polonica A; 2010, 117, 5; 803-807
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Effect of Low Temperature Annealing on Microstructural and Optical Properties of $(BaTiO_3)_{0.84}(CeO_2)_{0.16}$ Thin Films
    Autorzy:
    Dughaish, Z.
    Powiązania:
    https://bibliotekanauki.pl/articles/1400390.pdf
    Data publikacji:
    2013-01
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.55.-a
    77.55.F-
    78.20.Ci
    78.66.-w
    81.15.-z
    81.40.Ef
    81.70.Fy
    Opis:
    $(BaTiO_3)_{0.84}(CeO_2)_{0.16}$ thin films were prepared by electron beam evaporation method. X-ray diffraction and scanning electron microscopy revealed the amorphous structure for the as-prepared films. The thin films were annealed at temperatures: 200, 300, 400 and 500C for 1 h in air. Small and low intensity crystalline peaks were observed at annealing temperature of 200C for 1 h. The intensity and the number of the crystalline peaks were increased with increasing annealing temperature. Nanocrystals, of dimensions in the range 60-76 nm, were obtained when the annealing was performed at 500°C. The indexed diffraction pattern of the annealed thin film revealed a monoclinic structure. A two-layer model was used to describe the experimental ellipsometric data. The Bruggeman effective medium approximation was used to describe the surface roughness layer and the Cauchy dispersion relation was used to describe the main $(BaTiO_3)_{0.84}(CeO_2)_{0.16}$ layer. The optical constants of the thin films over 300-1100 nm spectral range were measured. The optical band gap showed gradual decrease with the annealing temperature. The accurate determination of the optical constants of the thin films is very useful and should be taken into consideration in the design of devices using optical thin films technology.
    Źródło:
    Acta Physica Polonica A; 2013, 123, 1; 87-91
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Characterization of ZnSe Nanolayers by Spectroscopic Ellipsometry
    Autorzy:
    Šćepanović, M.
    Grujić-Brojčin, M.
    Nesheva, D.
    Levi, Z.
    Bineva, I.
    Popović, Z.
    Powiązania:
    https://bibliotekanauki.pl/articles/1795712.pdf
    Data publikacji:
    2009-10
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    81.07.-b
    81.15.-z
    81.05.Dz
    78.30.-j
    07.60.Fs
    68.55.-a
    Opis:
    Single layers of ZnSe with thicknesses of 30, 40, 50, 70 and 100 nm are deposited at room substrate temperature by thermal evaporation of ZnSe powder in vacuum. The layers surface morphology has been investigated by atomic force microscopy. Structural characterization by the Raman scattering measurement revealed the existence of randomly oriented crystalline ZnSe particles in all layers, and the presence of amorphous phase in layers thinner than 100 nm. The ellipsometric measurements were performed in the range from 1.5 to 5 eV at room temperature in air. To interpret the experimental results, the Bruggeman effective medium approximation of dielectric function of ZnSe layers has been used, representing the layers as different mixtures of crystalline ZnSe (c-ZnSe), amorphous ZnSe (a-ZnSe), and voids. The assumption of polycrystalline ZnSe layers modeled as mixture of porous c-ZnSe (with volume fraction of voids ≈ 0.17) and a-ZnSe gives the best fit of ellipsometric experimental data. Single layer thicknesses similar to those expected from preparation conditions have been obtained by this fitting procedure. It has been also found that decrease in the layer thickness causes an increase of the volume fraction of a-ZnSe. Thus, c-ZnSe/a-ZnSe ratio, porosity and layer thickness obtained by spectroscopic ellipsometry, provides useful information about crystallinity and micro-/nanostructure of ZnSe nanolayers.
    Źródło:
    Acta Physica Polonica A; 2009, 116, 4; 708-711
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-9 z 9

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