- Tytuł:
- Confocal Microscope Studies of $MoS_{2}$ Layer Thickness
- Autorzy:
-
Grzeszczyk, M.
Gołasa, K.
Piętka, B.
Babiński, A.
Szczytko, J. - Powiązania:
- https://bibliotekanauki.pl/articles/1377207.pdf
- Data publikacji:
- 2014-11
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
78.20.Ci
63.20.dd
78.30.-j
78.66.Li - Opis:
- We have been studying micro-luminescence of various exfoliated $MoS_{2}$ flakes using a confocal microscope. A crucial issue is to determine thickness of the investigated layer. The common way - using atomic force microscopy, electron microscopy or the Raman spectroscopy - requires moving the sample out from the confocal microscope experimental setup and looking for a particular exfoliated flake hidden among thousands of others. In order to preliminarily determine thickness of investigated layers we have performed a study on optical reflectivity and compared the results with the Raman spectroscopy investigations. In this way we were able to calibrate our experimental setup. Optical measurements are much faster than the Raman spectroscopy and can give a good estimation of $MoS_{2}$ thickness.
- Źródło:
-
Acta Physica Polonica A; 2014, 126, 5; 1207-1208
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł