Temat: Li - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Relative Reflection Difference as a Method for Measuring the Thickness of the Exfoliated MoSe₂ Layers
Autorzy:: Łempicka, K.
Norowski, K.
Grzeszczyk, M.
Król, M.
Lekenta, K.
Babiński, A.
Piętka, B.
Szczytko, J.
Powiązania:: https://bibliotekanauki.pl/articles/1033778.pdf
Data publikacji:: 2017-08
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 63.20.dd
78.20.Ci
78.30.-j
78.66.Li
Opis:: We propose a method for measuring the thickness of the exfoliated MoSe₂ layers deposited on Si/SiO₂ substrate, based on the reflectance measurements performed with laser light illumination at two different wavelengths: red and green from confocal microscope at room temperature. We demonstrate the correlation between the number of layers in a flake and the value of its relative reflection difference. We applied the transfer matrix method to calculate the reflectivity and verify our experimental results. The approach proposed by us allows for fast and automatic verification of the exfoliated MoSe₂ layers thickness on large areas of the substrate.
Źródło:: Acta Physica Polonica A; 2017, 132, 2; 316-318
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Optical and Structural Studies of Sol-Gel Deposited Nanostructured CdO Thin Films: Annealing Effect
Autorzy:: Abdolahzadeh Ziabari, A.
Ghodsi, F.
Powiązania:: https://bibliotekanauki.pl/articles/1493680.pdf
Data publikacji:: 2011-09
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 78.20.Ci
78.66.Li
78.67.-n
81.20.Fw
Opis:: Nanocrystalline CdO thin films were prepared by sol-gel dip-coating method using a different solution. The as-deposited films were subjected to drying temperature of 120° in air. The prepared films were annealed in different temperatures of 200, 300 and 400°C. The characterization of samples was carried out by X-ray diffraction, scanning electron microscopy and UV-VIS spectroscopy. Results show that the samples are polycrystalline in nature and the crystallinity of the films improves with temperature. The average grain size is in the range of 19-34 nm. It was observed that the optical parameters of the films were affected by annealing temperature.
Źródło:: Acta Physica Polonica A; 2011, 120, 3; 536-540
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 3.

Tytuł:: Confocal Microscope Studies of $MoS_{2}$ Layer Thickness
Autorzy:: Grzeszczyk, M.
Gołasa, K.
Piętka, B.
Babiński, A.
Szczytko, J.
Powiązania:: https://bibliotekanauki.pl/articles/1377207.pdf
Data publikacji:: 2014-11
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 78.20.Ci
63.20.dd
78.30.-j
78.66.Li
Opis:: We have been studying micro-luminescence of various exfoliated $MoS_{2}$ flakes using a confocal microscope. A crucial issue is to determine thickness of the investigated layer. The common way - using atomic force microscopy, electron microscopy or the Raman spectroscopy - requires moving the sample out from the confocal microscope experimental setup and looking for a particular exfoliated flake hidden among thousands of others. In order to preliminarily determine thickness of investigated layers we have performed a study on optical reflectivity and compared the results with the Raman spectroscopy investigations. In this way we were able to calibrate our experimental setup. Optical measurements are much faster than the Raman spectroscopy and can give a good estimation of $MoS_{2}$ thickness.
Źródło:: Acta Physica Polonica A; 2014, 126, 5; 1207-1208
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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