Temat: 61.10.Dp - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Surface Roughness by X-ray and Neutron Scattering Methods
Autorzy:: Sinha, S. K.
Powiązania:: https://bibliotekanauki.pl/articles/1945176.pdf
Data publikacji:: 1996-02
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 61.10.Dp
68.35.Bs
78.20.Ci
Opis:: We discuss how the roughness and morphology of surfaces and interfaces can be characterized by the nondestructive techniques of X-ray and neutron scattering. We first discuss the mathematical description of rough surfaces in terms of correlation functions and then discuss the various kinds of rough surfaces which exist. These fall into the category of self-affine (Gaussian) surfaces, surfaces with capillary wave fluctuations, stepped surfaces, and surfaces with islands or pits. We then discuss how the scattering from such surfaces may be described and which types of information are available from specular reflectivity, off-specular (diffuse) scattering, and grazing incidence reflection experiments, including a comparison with results obtained by other surface techniques. We then discuss multiple rough interfaces and the scattering from thin films and multilayers. Finally, we shall discuss scattering of neutrons by magnetically rough surfaces and multilayers.
Źródło:: Acta Physica Polonica A; 1996, 89, 2; 219-234
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Comparative Studies of Surface Roughness of Thin Epitaxial Si Films by Computer Simulations and Experimental X-Ray and Optical Methods
Autorzy:: Żymierska, D.
Auleytner, J.
Domagała, J.
Szewczyk, A.
Dmitruk, N.
Powiązania:: https://bibliotekanauki.pl/articles/1964181.pdf
Data publikacji:: 1997-05
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 78.20.Ci
68.35.Bs
61.10.Dp
Opis:: The paper presents investigations of the surface roughness of epitaxial silicon films obtained by chemical vapour deposition with chloric and MOCVD processes. The flat surfaces of films and chemically etched surfaces of substrates were studied by optical methods as well as by X-ray reflectivity at grazing incidence. The computer simulations based on Fresnel theory were compared with the experimental results.
Źródło:: Acta Physica Polonica A; 1997, 91, 5; 1025-1030
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 3.

Tytuł:: Determination of Surface Roughness by Grazing Incidence X-ray Reflectivity
Autorzy:: Żymierska, D.
Powiązania:: https://bibliotekanauki.pl/articles/1945234.pdf
Data publikacji:: 1996-03
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 61.10.Dp
68.35.Bs
78.20.Ci
Opis:: The paper presents theoretical calculations of grazing incidence X-ray reflectivity curves for iron and nickel crystals. The computer simulations based on Fresnel theory take into account damping (as the result of surface roughness), which is different from the usual Rayleigh damping. The calculations are performed for a wide range of wavelengths and roughness and also for different distribution of roughness on the surface.
Źródło:: Acta Physica Polonica A; 1996, 89, 3; 347-352
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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