- Tytuł:
- Relative Reflection Difference as a Method for Measuring the Thickness of the Exfoliated MoSe₂ Layers
- Autorzy:
-
Łempicka, K.
Norowski, K.
Grzeszczyk, M.
Król, M.
Lekenta, K.
Babiński, A.
Piętka, B.
Szczytko, J. - Powiązania:
- https://bibliotekanauki.pl/articles/1033778.pdf
- Data publikacji:
- 2017-08
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
63.20.dd
78.20.Ci
78.30.-j
78.66.Li - Opis:
- We propose a method for measuring the thickness of the exfoliated MoSe₂ layers deposited on Si/SiO₂ substrate, based on the reflectance measurements performed with laser light illumination at two different wavelengths: red and green from confocal microscope at room temperature. We demonstrate the correlation between the number of layers in a flake and the value of its relative reflection difference. We applied the transfer matrix method to calculate the reflectivity and verify our experimental results. The approach proposed by us allows for fast and automatic verification of the exfoliated MoSe₂ layers thickness on large areas of the substrate.
- Źródło:
-
Acta Physica Polonica A; 2017, 132, 2; 316-318
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł