- Tytuł:
- Exchange Bias in Ni-Mn-Sn Heusler Alloy Films
- Autorzy:
-
Gościańska, I.
Załęski, K.
Głowiński, H.
Kudryavtsev, Yu.
Dubowik, J. - Powiązania:
- https://bibliotekanauki.pl/articles/1427549.pdf
- Data publikacji:
- 2012-05
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
75.70.Ak
75.30.Et - Opis:
- We report a relatively large exchange bias effect observed for the first time in Ni-Mn-Sn thin films with different microstructure and composition: a $Ni_{50}Mn_{36}Sn_{14}$ epitaxial film (A), a $Ni_{50}Mn_{43}Sn_7$ film which is phase decomposed (B), and a $NiMn//Ni_{50}Mn_{25}Sn_{25}$ bilayer (C). Despite the samples differ markedly in both microstructure and composition $H_{EB}$ does not substantially differs at 5 K. Exchange bias decreases with increasing T approximately as $H_{EB}$ (T) ∝ $H_{EB}$ (5K)/T with $H_{EB}$ (5K) of 180 Oe and 60 Oe for sample B and C, respectively and almost linearly for sample A with $H_{EB}$ (5K) = 65 Oe. Blocking temperature where the exchange bias vanishes is 40, 50 and 80 K for sample A, C and B, respectively. The results suggest that the role of AFM/FM interfaces is not substantial in formation of exchange bias in Ni-Mn-Sn Heusler alloy films and exchange bias is rather related to AFM/FM interactions in nanoscale.
- Źródło:
-
Acta Physica Polonica A; 2012, 121, 5-6; 1179-1181
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł