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Wyszukujesz frazę "81.15.Ef" wg kryterium: Temat


Wyświetlanie 1-4 z 4
Tytuł:
Raman Scattering from ZnSe Nanolayers
Autorzy:
Nesheva, D.
Šćepanović, M.
Aškrabić, S.
Levi, Z.
Bineva, I.
Popović, Z.
Powiązania:
https://bibliotekanauki.pl/articles/1807824.pdf
Data publikacji:
2009-07
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
81.15.Ef
81.05.Dz
78.30.-j
68.55.-a
Opis:
A series of ZnSe single layers having thickness between 30 nm and 1 μm was deposited on c-Si and glass substrates at room substrate temperature. Thermal evaporation of ZnSe powder in high vacuum has been applied. Moreover, $SiO_x$/ZnSe periodic multilayers prepared by the same deposition technique and having ZnSe layer thickness of 2 and 4 nm have been studied. Raman spectra were measured at 295 K, using the 442 nm line of a He-Cd laser as well as different lines of the $Ar^+$ or $Ar^+//Kr^+$ lasers. The observed Raman features have been related to multiple optical phonon (1LO to 4LO) light scattering and connected with the existence of randomly oriented crystalline ZnSe grains in both ZnSe single layers and ZnSe layers of the multilayers. Relatively large line width ( ≈ 15 $cm^{-1}$) of the 1LO band has been observed and related to lattice distortion in the crystalline grains and existence of amorphous phase in the layers thinner than 100 nm. The Raman spectra measured on both ZnSe single layers and $SiO_x$/ZnSe multilayers using the 488 nm line with a gradually increased laser beam power indicate an increased crystallinity at high irradiation levels.
Źródło:
Acta Physica Polonica A; 2009, 116, 1; 75-77
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Analysis of Thin Films by Time-of-Flight Low Energy Ion Scattering
Autorzy:
Průša, S.
Kolíbal, M.
Bábor, P.
Mach, J.
Šikola, T.
Powiązania:
https://bibliotekanauki.pl/articles/2047292.pdf
Data publikacji:
2007-03
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.49.Sf
81.05.Cy
68.55.-a
81.15.Ef
Opis:
In the paper the design and application of a time-of-flight low energy ion scattering instrument built into an UHV complex deposition and analytical apparatus is described. A special attention is aimed at demonstrating the ability of time-of-flight low energy ion scattering to analyse near-to-surface layers of thin films prepared both ex situ and in situ. It is shown that the broadening of peaks in time-of-flight low energy ion scattering spectra can be attributed to multiple scattering and inelastic losses of ions in deeper layers. As a result of that, the peak width of ultrathin films depends on their thickness.
Źródło:
Acta Physica Polonica A; 2007, 111, 3; 335-341
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Temperature Dependence of Ag Film Roughening during Deposition on Quasicrystal and Approximant Surfaces
Autorzy:
Ünal, B.
Evans, J.
Thiel, P.
Powiązania:
https://bibliotekanauki.pl/articles/1373681.pdf
Data publikacji:
2014-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.55.-a
61.44.Br
68.37.Ef
81.15.Aa
Opis:
The temperature (T) dependence of roughening as assessed by scanning tunneling microscopy is compared for growth of Ag films on an 5-fold icosahedral Al-Pd-Mn quasicrystal surface and on an ξ'-approximant. Growth on the quasicrystal corresponds to a version of the Volmer-Weber growth, but modified by quantum size effects, and also by kinetic smoothening at low T and low coverages (θ). Growth on the approximant corresponds to a version of the Stranski-Krastanov growth modified by kinetic roughening at low T and low θ. For larger θ, i.e., for thicker films, distinct behavior is observed.
Źródło:
Acta Physica Polonica A; 2014, 126, 2; 608-612
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Effect of Low Temperature Annealing on Microstructural and Optical Properties of $(BaTiO_3)_{0.84}(CeO_2)_{0.16}$ Thin Films
Autorzy:
Dughaish, Z.
Powiązania:
https://bibliotekanauki.pl/articles/1400390.pdf
Data publikacji:
2013-01
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.55.-a
77.55.F-
78.20.Ci
78.66.-w
81.15.-z
81.40.Ef
81.70.Fy
Opis:
$(BaTiO_3)_{0.84}(CeO_2)_{0.16}$ thin films were prepared by electron beam evaporation method. X-ray diffraction and scanning electron microscopy revealed the amorphous structure for the as-prepared films. The thin films were annealed at temperatures: 200, 300, 400 and 500C for 1 h in air. Small and low intensity crystalline peaks were observed at annealing temperature of 200C for 1 h. The intensity and the number of the crystalline peaks were increased with increasing annealing temperature. Nanocrystals, of dimensions in the range 60-76 nm, were obtained when the annealing was performed at 500°C. The indexed diffraction pattern of the annealed thin film revealed a monoclinic structure. A two-layer model was used to describe the experimental ellipsometric data. The Bruggeman effective medium approximation was used to describe the surface roughness layer and the Cauchy dispersion relation was used to describe the main $(BaTiO_3)_{0.84}(CeO_2)_{0.16}$ layer. The optical constants of the thin films over 300-1100 nm spectral range were measured. The optical band gap showed gradual decrease with the annealing temperature. The accurate determination of the optical constants of the thin films is very useful and should be taken into consideration in the design of devices using optical thin films technology.
Źródło:
Acta Physica Polonica A; 2013, 123, 1; 87-91
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-4 z 4

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