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Wyświetlanie 1-2 z 2
Tytuł:
Ion Beam Analysis of Hydrogen-Treated Ti/TiN Protective Nanomultilayers
Autorzy:
Kakuee, O.
Fathollahi, V.
Lamehi-Rachti, M.
Oliaiy, P.
Seyedi, H.
Safa, S.
Mojtahedzadeh Larijani, M.
Moazzami, H.
Powiązania:
https://bibliotekanauki.pl/articles/1419781.pdf
Data publikacji:
2012-07
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.43.-h
68.49.-h
81.15.Jj
25.45.-z
Opis:
Ti/TiN multilayer films with a few multilayer periods and a total sub-μm thickness were deposited on AISI 304 stainless steel substrates by ion coating deposition technique. To investigate the effect of hydrogen treatment on the corrosion behavior of the multilayers, some of the samples were hydrogen treated after deposition of the first and/or the second Ti interlayer. $\text{}^{14}N(d,\alpha_1) \text{}^{12}C$ nuclear reaction and the Rutherford backscattering spectrometry were used to obtain the atomic composition profiles and thickness of Ti/TiN layers. Nuclear reaction analysis confirmed the presence of two separable TiN layers of comparable thickness on the surface and in depth of the two-period multilayers. These techniques were used to determine the thickness of individual Ti and TiN layers and revealed that the stoichiometry of TiN layers was approximately Ti:N=1:1. Hydrogen depth profile in the prepared samples was obtained by elastic recoil detection analysis. It was found that a remarkable volume of hydrogen was uptaken by the Ti layer in the hydrogen treated samples. The TiN (200) diffraction peak in the X-ray diffraction pattern was observed with different intensities depending on the sample preparation parameters. The corrosion behavior of the multilayers was studied by means of potentiodynamic polarization in 0.5 M NaCl solutions. It was found that the hydrogen treatment of Ti interlayer could potentially improve the corrosion properties of the Ti/TiN layers.
Źródło:
Acta Physica Polonica A; 2012, 122, 1; 132-137
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Inelastic X-Ray Scattering Studies of Phonon Dispersion in PbTe and (Pb,Cd)Te Solid Solution
Autorzy:
Kuna, R.
Minikayev, R.
Trzyna, M.
Gas, K.
Bosak, A.
Szczerbakow, A.
Petit, S.
Łażewski, J.
Szuszkiewicz, W.
Powiązania:
https://bibliotekanauki.pl/articles/1398584.pdf
Data publikacji:
2016-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
63.20.D-
68.43.-h
68.49.Sf
Opis:
PbTe and its solid solution (Pb,Cd)Te containing 2% of CdTe and PbTe grown by self-selecting vapour growth technique were investigated by inelastic X-ray scattering using synchrotron radiation. The ID28 beamline at ESRF with the incident photon energy of 17794 eV and the energy resolution of 3 meV was applied for that purpose. The measurements were performed at room temperature along [001]-type high symmetry direction in the Brillouin zone. In spite of a very low energy of phonon branches they can be determined by inelastic X-ray scattering with a high accuracy. The transversal acoustic phonon dispersion obtained by inelastic X-ray scattering corresponds well to those resulting from inelastic neutron scattering measurements and ab initio calculations. Apart from expected structures corresponding to the bulk phonons an additional scattering related to the crystal surface properties was observed in the inelastic X-ray scattering spectra. The analysis performed with the use of secondary ion mass spectroscopy technique demonstrated a presence of a thin oxide layer at sample surfaces.
Źródło:
Acta Physica Polonica A; 2016, 130, 5; 1251-1254
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-2 z 2

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