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Wyświetlanie 1-4 z 4
Tytuł:
Production of Sodium Silicate Cullets by Using Trona
Autorzy:
Özkan, İ.
Powiązania:
https://bibliotekanauki.pl/articles/1398696.pdf
Data publikacji:
2016-04
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.35.bj
Opis:
This study focuses on production and characterization of sodium silicate cullet by using trona. Sodium silicate cullets are generally produced by direct fusion of precisely measured portions of soda ash (Na₂CO₃) and quartz (SiO₂). In this study trona (Na₂CO₃· NaHCO₃· 2H₂O) was used as a source of soda ash. For this purpose trona sample was first characterized by X-ray diffraction, scanning electron microscopy, differential thermal analysis/thermal gravimetry and chemical analyses. Different batches were prepared and fused to produce sodium silicates varying in ratio Na₂O· nSiO₂. Produced samples were evaluated by X-ray diffraction and scanning electron microscopy. The results showed that trona can be used instead of soda ash to produce sodium silicate cullets.
Źródło:
Acta Physica Polonica A; 2016, 129, 4; 451-454
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Potential Energy Surfaces for H Adsorbed at 4H-SiC{0001} Surfaces
Autorzy:
Wachowicz, E.
Kiejna, A.
Powiązania:
https://bibliotekanauki.pl/articles/1399071.pdf
Data publikacji:
2013-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.35.bg
68.35.bj
68.43.-h
71.15.Mb
Opis:
The constant adsorption energy surfaces for hydrogen adsorbed on Si- and C-terminated hexagonal 4H-SiC{0001} surfaces have been calculated within density functional theory framework. The two unreconstructed and one reconstructed √3 × √3 surfaces were taken into account. We show that on all surfaces there is a global energy minimum indicating the most favourable adsorption site corresponding to H atom adsorption on-top of the topmost substrate layer atom. In case of reconstructed surface, there is another small and shallow local minimum. Moreover, the diffusion barrier is much higher at reconstructed surface than at unreconstructed ones.
Źródło:
Acta Physica Polonica A; 2013, 124, 5; 765-767
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Validity of Swanepoels Method for Calculating the Optical Constants of Thick Films
Autorzy:
Shaaban, E.
Yahia, I.
El-Metwally, E.
Powiązania:
https://bibliotekanauki.pl/articles/1489840.pdf
Data publikacji:
2012-03
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.35.bj
61.05.cp
78.20.Ci
Opis:
Optical constants, dispersion and oscillator parameters of different thicknesses of amorphous $Ge_{25}Cd_5Se_{70}$ films have been deposited onto glass substrates using thermal evaporation technique. The optical constants have been investigated by optical spectrophotometry measurements. The straight forward analysis proposed by Swanepoel, which is based on the use of the extremes of the interference fringes has been used in order to derive the refractive index and the film thickness in μm range. The refractive index could be extrapolated by the Cauchy dispersion relationship over the whole spectral range, which extended from 400 to 2500 nm. It is observed that, refractive index n increases with the film thickness. The possible optical transition is found to be allowed indirect transition with energy gap increase from 1.915 to 1.975 eV with increasing film thickness. The dispersion of the refractive index is discussed in terms of the Wemple-DiDomenico single oscillator model. The interband oscillator wavelength, the average oscillator strength, and the optical conductivity were estimated for different thicknesses of amorphous $Ge_{25}Cd_5Se_{70}$ films.
Źródło:
Acta Physica Polonica A; 2012, 121, 3; 628-635
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
X-Ray Photoelectron Spectroscopy - Methodology and Application
Autorzy:
Papis-Polakowska, E.
White, R.
Deeks, C.
Mannsberger, M.
Krajewska, A.
Strupinski, W.
Płocinski, T.
Jankowska, O.
Powiązania:
https://bibliotekanauki.pl/articles/1364037.pdf
Data publikacji:
2014-04
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
79.60.-i
81.05.ue
68.47.Gh
68.35.bg
68.35.bj
Opis:
The crucial measurements aspects of X-ray photoelectron spectroscopy, such as chemical state analysis, depth profiling, mapping, and thickness calculation have been presented. The metal alloys, $Ti_2O_5$, graphene and type-II InAs/GaSb superlattice structures have been examined by using the new Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer.
Źródło:
Acta Physica Polonica A; 2014, 125, 4; 1061-1064
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-4 z 4

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