Wszystkie pola: interface layer - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Layer and Interface Structure of CoFe/Ru Multilayers
Autorzy:: Pym, A.
Lamperti, A.
Cardoso, S.
Freitas, P.
Tanner, B.
Powiązania:: https://bibliotekanauki.pl/articles/1814028.pdf
Data publikacji:: 2007-12
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 61.10.Kw
68.65.Ac
68.35.Ct
75.50.Kj
85.75.Dd
85.70.Ay
Opis:: Grazing incidence X-ray scattering measurements have been performed to probe the structure of CoFe/Ru layers and their interfaces. It was found that the interface width increased approximately linearly with the layer number from the substrate in a multilayer and that a substantial asymmetry existed between the width of CoFe/Ru and Ru/CoFe interfaces. By co-minimizing both the specular and diffuse scatter with that simulated from a model structure, the topological roughness amplitude was determined to be comparable to the intermixing interface width.
Źródło:: Acta Physica Polonica A; 2007, 112, 6; 1243-1248
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Interface Properties of Single and Bi-Layer $Fe_3O_4$ Films Grown on MgO(001) Studied by RBS and Channeling Experiments
Autorzy:: Kim-Ngan, N.
Balogh, A.
Brötz, J.
Zając, M.
Korecki, J.
Powiązania:: https://bibliotekanauki.pl/articles/1535628.pdf
Data publikacji:: 2010-10
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 34.35.+a
68.35.Ct
68.35.Fx
68.47.Gh
Opis:: Series of $Fe_3O_4$/MgO(001) and $Fe_3O_4$/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20 ÷ 150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV $He^{+}$ ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV $He^{+}$ ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one.
Źródło:: Acta Physica Polonica A; 2010, 118, 4; 570-575
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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