- Tytuł:
- Phonon Deformation Potentials from Raman Measurements on Semiconductor Membranes
- Autorzy:
-
Trzeciakowski, W.
Martinez-Pastor, J.
Martinez-Criado, G. - Powiązania:
- https://bibliotekanauki.pl/articles/1968438.pdf
- Data publikacji:
- 1997-11
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
78.30.Fs
78.20.Hp
63.20.Ry - Opis:
- It is shown that the phonon deformation potentials in semiconductors can be determined by Raman scattering on hydrostatically and biaxially deformed samples. The complete data includes biaxial deformation in the (100), (111), and (110) planes. Biaxial strain is applied to the sample using the recently developed membrane method. The phonon displacement under biaxial strain can be directly obtained from Raman measurements on a single membrane provided we determine the strain from the splitting of the band gap using e.g. the photoreflectance technique. Alternatively, the ratios of different phonon shifts can supply the necessary information. The method is illustrated with experimental results for GaP.
- Źródło:
-
Acta Physica Polonica A; 1997, 92, 5; 1033-1037
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł