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    Wyświetlanie 1-6 z 6
    Tytuł:
    Interference Fringes in the Plane Wave Topographic Images of Growth Bands in Si:Ge
    Autorzy:
    Wieteska, K.
    Wierzchowski, W.
    Graeff, W.
    Lefeld-Sosnowska, M.
    Regulska, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/2030662.pdf
    Data publikacji:
    2002-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.72.Ff
    Opis:
    An Si:Ge crystal with approximately 3% of germanium was studied with strongly collimated short-wavelength monochromatic synchrotron beam (beamline E2 at HASYLAB). The topographs obtained in the asymmetric 224 reflection revealed the presence of interference fringes related to growth bands caused by segregation of germanium. The fringes, observed for the first time, were strongly dependent on the angular setting and it was possible to distinguish at least three systems of fringes. A number of features of the existing strain field, which may be important for the formation of the fringes, was determined using other topographic methods, especially the Bragg-case section topography.
    Źródło:
    Acta Physica Polonica A; 2002, 101, 5; 729-734
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of $SrLaGaO_4$
    Autorzy:
    Malinowska, A.
    Lefeld-Sosnowska, M.
    Wieteska, K.
    Wierzchowski, W.
    Pajączkowska, A.
    Graeff, W.
    Powiązania:
    https://bibliotekanauki.pl/articles/1812255.pdf
    Data publikacji:
    2008-08
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.72.Ff
    61.72.Nn
    61.72.Lk
    61.72.Qq
    Opis:
    $SrLaGaO_4$ single crystals are perspective substrate materials for high temperature superconductors thin films, elements of thermal radiation receivers and other electronic devices. The defect structure of the Czochralski grown $SrLaGaO_4$ crystal was investigated by means of X-ray topography exploring both conventional and synchrotron sources. The crystal lattice defects in the core region of the crystal were investigated. The regular network of defects arranged in rows only in ⟨100⟩ direction was observed. Owing to high resolution of synchrotron radiation white beam back reflection topographs one can distinguish individual spots forming the lines of the rows. It can be supposed that these elongated rod-like volume defects are located in 100 lattice planes forming a kind of walls. They are built approximately of the same phase as crystal but crystallize at a different moment than a rest of the crystal due to the constitutional supercooling.
    Źródło:
    Acta Physica Polonica A; 2008, 114, 2; 433-438
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    X-Ray Topographic Studies of Defect Structure in $YVO_4$ Crystals
    Autorzy:
    Wieteska, K.
    Wierzchowski, W.
    Łukasiewicz, T.
    Wierzbicka, E.
    Malinowska, A.
    Lefeld-Sosnowska, M.
    Graeff, W.
    Powiązania:
    https://bibliotekanauki.pl/articles/1812259.pdf
    Data publikacji:
    2008-08
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.72.Ff
    Opis:
    The perfection of $YVO_4$ crystals, which are predicted to replace formerly used YAG garnets due to higher quantum efficiency and lower excitation level, was studied. The investigations of Czochralski grown undoped $YVO_4$ single crystals were performed mainly by means of X-ray topographic methods. Both synchrotron and conventional X-ray sources were used. The study revealed relatively high density of weak point-like contrasts which can be most probably interpreted as dislocation outcrops. In regions of the crystal close to its boundary we observed glide bands. It was also found that in some regions the dislocations form local subgrain boundaries. The white beam back reflection and monochromatic beam topography allowed to evaluate a local misorientation which not exceeded several angular minutes. No segregation fringes were observed proving a good homogeneity of chemical composition.
    Źródło:
    Acta Physica Polonica A; 2008, 114, 2; 455-461
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Influence of SiC Surface Preparation on Homoepitaxial Growth; X-ray Reflectometric Studies
    Autorzy:
    Mazur, K.
    Wierzchowski, W.
    Wieteska, K.
    Hofman, W.
    Sakowska, H.
    Kościewicz, K.
    Strupiński, W.
    Graeff, W.
    Powiązania:
    https://bibliotekanauki.pl/articles/1538812.pdf
    Data publikacji:
    2010-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.05.cm
    61.72.Ff
    61.72.up
    Opis:
    X-ray reflectometric and diffraction topographic methods were applied for examination of 4H and 6H silicon carbide substrates finished with various regimes, as well as, silicon carbide epitaxial layers. The investigations indicated a very good quality of the substrate surfaces finished with the process established at the Institute of Electronic Materials Technology, which provided the surface roughness σ = 0.55 ± 0.07 nm for 4H-SiC wafers. These values were better than those of substrate wafers offered by many commercial producers. The surface roughness was decreased during the initial high temperature etching to σ = 0.22 ± 0.07 nm. A relatively good structural quality was confirmed in the case of 4H epitaxial wafers deposited on the substrates prepared from the crystals manufactured at the IEMT, with the 8° off-cut from the main (001) plane.
    Źródło:
    Acta Physica Polonica A; 2010, 117, 2; 272-276
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    X-ray Topographic Investigations of Domain Structure in Czochralski Grown $Pr_{x}La_{1-x}AlO_{3}$ Crystals
    Autorzy:
    Wieteska, K.
    Wierzchowski, W.
    Malinowska, A.
    Turczyński, S.
    Lefeld-Sosnowska, M.
    Pawlak, D.
    Łukasiewicz, T.
    Graeff, W.
    Powiązania:
    https://bibliotekanauki.pl/articles/1538809.pdf
    Data publikacji:
    2010-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    81.05.-t
    81.10.Dn
    61.72.Ff
    Opis:
    In the present paper X-ray diffraction topographic techniques were applied to a number of samples cut from Czochralski grown $Pr_{x}La_{1-x}AlO_{3}$ crystals with different ratio of praseodymium and lanthanum. Conventional and synchrotron X-ray topographic investigations revealed differently developed domain structures dependent on the composition of mixed praseodymium lanthanum aluminium perovskites. Some large mosaic blocks were observed together with the domains. In the best crystals, X-ray topographs revealed striation fringes and individual dislocations inside large domains. Synchrotron topographs allowed us to indicate that the domains correspond to three different crystallographic planes, and to evaluate the lattice misorientation between domains in the range of 20-50 arc min.
    Źródło:
    Acta Physica Polonica A; 2010, 117, 2; 268-271
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Defect Structure Formed at Different Stages οf Growth Process in Erbium, Calcium and Holmium Doped $YVO_{4}$ Crystals
    Autorzy:
    Malinowska, A.
    Wierzbicka, E.
    Lefeld-Sosnowska, M.
    Wieteska, K.
    Wierzchowski, W.
    Łukasiewicz, T.
    Świrkowicz, M.
    Graeff, W.
    Powiązania:
    https://bibliotekanauki.pl/articles/1538950.pdf
    Data publikacji:
    2010-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.72.Ff
    Opis:
    The defect structure of $YVO_{4}$ single crystals doped with $Er^{3+},$ $Ho^{3+}$ and $Ca^{2+}$ were studied by X-ray diffraction topographic methods, using laboratory and synchrotron radiation sources. Variously developed block structure was the dominating imperfection of the investigated crystals observed both in conventional Lang and synchrotron topographs. The evaluation of block misorientation was realised by means of superimposed projection and section white beam synchrotron radiation topographs. More possibilities of following the mutual rotation of blocks were provided by means of white beam synchrotron radiation WBSR projection topographs exposed through the fine mesh.
    Źródło:
    Acta Physica Polonica A; 2010, 117, 2; 328-331
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-6 z 6

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