- Tytuł:
- Spectroscopic Ellipsometry of Porphyrin Adsorbed in Porous Silicon
- Autorzy:
-
Babonas, G.
Snitka, V.
Rodaitė, R.
Šimkienė, I.
Rėza, A.
Treideris, M. - Powiązania:
- https://bibliotekanauki.pl/articles/1178739.pdf
- Data publikacji:
- 2005-02
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
78.68.+m
61.43.-j
61.43.Gt - Opis:
- Aqueous solution of meso-tetra(4-sulfonatophenyl)porphine was deposited on electrochemically etched n-Si wafers. The morphology of the hybrid systems was investigated by scanning electron microscope and atomic force microscope techniques. The optical response of the hybrid systems was studied by spectroscopic ellipsometry in the range of 1-5 eV. Particular features in adsorption process were revealed for meso-tetra(4-sulfonatophenyl)porphine deposited on variously chemically treated Si substrates. It was found that porphyrin J-aggregates can be intercalated into large pores formed in a bulk n-Si as well as into nanopores of luminescent oxide layer.
- Źródło:
-
Acta Physica Polonica A; 2005, 107, 2; 319-323
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł