- Tytuł:
- Nanostructuring and Hardness Investigations of Thin Films by Scanning Force Microscopy
- Autorzy:
-
Nowicki, M.
Richter, A.
Ries, R.
Oszwałdowski, M. - Powiązania:
- https://bibliotekanauki.pl/articles/1968828.pdf
- Data publikacji:
- 1998-02
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
61.16.Ch
68.35.-p - Opis:
- The scanning force microscope was used to scratch thin films and to write nanoscale pattern on surfaces as well as to perform nanoindentation for hardness measurements. Different thin film materials such as C$\text{}_{60}$ films, diamond-like carbon, metals and semiconducting films have been investigated.
- Źródło:
-
Acta Physica Polonica A; 1998, 93, 2; 437-441
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł