- Tytuł:
- Metrological Applications of X-ray Waveguide Thin Film Structures in X-ray Reflectometry and Diffraction
- Autorzy:
-
Pełka, J. B.
Lagomarsino, S. - Powiązania:
- https://bibliotekanauki.pl/articles/2035489.pdf
- Data publikacji:
- 2002-08
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
68.65.-k
61.10.Kw
06.30.Bp - Opis:
- The effect of resonance, observed in X-ray waveguide layered structures in a characteristic way influences the scattering properties of the films. It is well known that in the resonant region the reflectivity shows a series of minima, usually very deep and extremely narrow. The positions and depths of the minima depend only on X-ray waveguide structural properties, on the X-ray wavelength and on the incident beam divergence. In the present work we propose and discuss the application of the X-ray waveguide and quasi X-ray waveguide film structures as tools to experimental evaluation of some quantities related to X-ray reflectometric or diffractometric measurements, like the beam divergence, wavelength, or angular distance. Examples of application of the X-ray waveguide as an excellent tool to estimate the effective beam divergence are shown. Properties of the X-ray waveguide elements as a handy wavelength or angular calibration standard are also mentioned.
- Źródło:
-
Acta Physica Polonica A; 2002, 102, 2; 233-238
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł