- Tytuł:
- Interface Properties of Single and Bi-Layer $Fe_3O_4$ Films Grown on MgO(001) Studied by RBS and Channeling Experiments
- Autorzy:
-
Kim-Ngan, N.
Balogh, A.
Brötz, J.
Zając, M.
Korecki, J. - Powiązania:
- https://bibliotekanauki.pl/articles/1535628.pdf
- Data publikacji:
- 2010-10
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
34.35.+a
68.35.Ct
68.35.Fx
68.47.Gh - Opis:
- Series of $Fe_3O_4$/MgO(001) and $Fe_3O_4$/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20 ÷ 150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV $He^{+}$ ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV $He^{+}$ ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one.
- Źródło:
-
Acta Physica Polonica A; 2010, 118, 4; 570-575
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł