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Wyświetlanie 1-2 z 2
Tytuł:
Optical Characterization of Laser-Synthesized Anatase $TiO_{2}$ Nanopowders by Spectroscopic Ellipsometry and Photoluminescence Measurements
Autorzy:
Šćepanović, M.
Grujić-Brojčin, M.
Mirić, M.
Dohčević-Mitrović, Z.
Popović, Z.
Powiązania:
https://bibliotekanauki.pl/articles/1795613.pdf
Data publikacji:
2009-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
81.07.Wx
78.67.Bf
73.22.-f
07.60.Fs
78.55.-m
Opis:
Nanosized titania $(TiO_{2})$ is synthesized by laser-induced pyrolysis using $TiCl_{4}$ as a liquid precursor. X-ray diffraction and Raman scattering confirmed anatase structure of $TiO_{2}$ nanocrystals. The dielectric function ε(ω) of $TiO_{2}$ nanopowders has been determined by spectroscopic ellipsometry in the energy range from 1.5 to 6 eV at room temperature. The features observed in ε(ω) have been fitted to analytical line shapes by using the second derivatives of experimental spectra. The energies corresponding to different interband electronic transitions have been determined. Photoluminescence measurements have been carried out in vacuum for T = 20 K and T = 300 K. Under laser irradiation with sub-band gap photon energy, anatase nanocrystals have displayed strong visible photoluminescence emission. In this broad photoluminescence band different variations of line shape and position with excitation energy and temperature are observed for nanopowders with different crystallite size, pointing out to the various electronic transitions mediated by defect levels within the band gap.
Źródło:
Acta Physica Polonica A; 2009, 116, 4; 603-606
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Characterization of ZnSe Nanolayers by Spectroscopic Ellipsometry
Autorzy:
Šćepanović, M.
Grujić-Brojčin, M.
Nesheva, D.
Levi, Z.
Bineva, I.
Popović, Z.
Powiązania:
https://bibliotekanauki.pl/articles/1795712.pdf
Data publikacji:
2009-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
81.07.-b
81.15.-z
81.05.Dz
78.30.-j
07.60.Fs
68.55.-a
Opis:
Single layers of ZnSe with thicknesses of 30, 40, 50, 70 and 100 nm are deposited at room substrate temperature by thermal evaporation of ZnSe powder in vacuum. The layers surface morphology has been investigated by atomic force microscopy. Structural characterization by the Raman scattering measurement revealed the existence of randomly oriented crystalline ZnSe particles in all layers, and the presence of amorphous phase in layers thinner than 100 nm. The ellipsometric measurements were performed in the range from 1.5 to 5 eV at room temperature in air. To interpret the experimental results, the Bruggeman effective medium approximation of dielectric function of ZnSe layers has been used, representing the layers as different mixtures of crystalline ZnSe (c-ZnSe), amorphous ZnSe (a-ZnSe), and voids. The assumption of polycrystalline ZnSe layers modeled as mixture of porous c-ZnSe (with volume fraction of voids ≈ 0.17) and a-ZnSe gives the best fit of ellipsometric experimental data. Single layer thicknesses similar to those expected from preparation conditions have been obtained by this fitting procedure. It has been also found that decrease in the layer thickness causes an increase of the volume fraction of a-ZnSe. Thus, c-ZnSe/a-ZnSe ratio, porosity and layer thickness obtained by spectroscopic ellipsometry, provides useful information about crystallinity and micro-/nanostructure of ZnSe nanolayers.
Źródło:
Acta Physica Polonica A; 2009, 116, 4; 708-711
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-2 z 2

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