Temat: 68.37.Ps - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Surface Composition of CIS Compound Affected by Xe⁺ Irradiation
Autorzy:: Tashlykov, I.
Zukowski, P.
Silvanovich, D.
Gremenok, V.
Powiązania:: https://bibliotekanauki.pl/articles/1402236.pdf
Data publikacji:: 2015-11
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 68.37.Ps
06.30.Bp
Opis:: The paper presents the results of investigation of element composition of CuInSe₂ (CIS) compounds obtained by vertical Bridgman technique and on a glass substrate by the thermal deposition of Cu-In thin films with the subsequent annealing in selenium vapour. The depth profile distribution of elements in these samples using the Rutherford backscattering spectrometry/channeling technique in conjunction with the RUMP code simulation is also discussed.
Źródło:: Acta Physica Polonica A; 2015, 128, 5; 927-930
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Elemental Composition, Topography and Wettability of $Pb_{x}Sn_{1 - x}S$ Thin Films
Autorzy:: Tashlykov, I.
Turavets, A.
Gremenok, V.
Żukowski, P.
Powiązania:: https://bibliotekanauki.pl/articles/1366292.pdf
Data publikacji:: 2014-06
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 68.37.Ps
06.30.Bp
Opis:: PbSnS thin films were prepared by hot-wall vacuum evaporation. The Rutherford backscattering technique was employed for the investigation of $Pb_{x}Sn_{1 - x}S$ thin films composition. With a help of atomic force microscopy the main stages in the development of the thin films were characterized. Contact angle measurements of water drop on $Pb_{x}Sn_{1 - x}S$ thin films have been conducted on our original setup.
Źródło:: Acta Physica Polonica A; 2014, 125, 6; 1339-1343
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 3.

Tytuł:: Application of atomic force microscopy for studies of fractal and functional properties of biomaterials
Autorzy:: Kulesza, S.
Bramowicz, M.
Czaja, P.
Jabłoński, R.
Kropiwnicki, J.
Charkiewicz, M.
Powiązania:: https://bibliotekanauki.pl/articles/1075857.pdf
Data publikacji:: 2016-10
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 06.30.Bp
68.37.Ps
68.35.bd
81.05.Bx
87.85.J-
Opis:: The paper presents results of numerical analysis of AFM images of a surface of sandblasted Ti6Al7Nb alloys before and after wet etching procedure usually used for preparing commercially viable dental implants. Obtained results demonstrate that etching procedure efficiently cleans the implants as it leaves almost pure Ti-Al-Nb surface with trace amounts of alkali metals and increased hydrophobicity. Apart of that, it turned out that simple statistical measures of the height variations (root mean square roughness) only slightly change upon the treatment procedure, especially for scan lengths below 20 μm. On the other hand, correlation analysis exhibits bifractal surface patterns composed of regular residues left on otherwise helical ridges of the base material. Etching leaves its fingerprint in fractal dimension, but not in the corner frequency.
Źródło:: Acta Physica Polonica A; 2016, 130, 4; 1013-1015
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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