- Tytuł:
- Investigation of Compound Relaxation Processes in Crystal Lattice Dynamics of Si Irradiated by Soft X-rays
- Autorzy:
-
Janavičius, A. J.
Purlys, R
Norgėla, Ž - Powiązania:
- https://bibliotekanauki.pl/articles/2044634.pdf
- Data publikacji:
- 2006-02
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
61.72.-y
61.72.Dd
05.50.+q - Opis:
- We applied soft X-rays for investigation of dynamics of Frenkel point defects in a Si crystal during its saturation with metastable vacancies with neighboring Si atoms in excited states or vacancies with neighboring Si atoms in interstitial states produced in the lattice after ejection of Auger electrons. The irradiated irregularities and defects of the lattice cause a change of Bragg reflection maxima. Several resonance phenomena related to the metastable states introduced into Si crystal by soft X-rays irradiation have been detected.
- Źródło:
-
Acta Physica Polonica A; 2006, 109, 2; 159-170
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł