- Tytuł:
- Application of Genetic Algorithm to Determine Thermal Properties of Microelectronic Layered Structures
- Autorzy:
-
Arsoba, R.
Suszyński, Z. - Powiązania:
- https://bibliotekanauki.pl/articles/92932.pdf
- Data publikacji:
- 2008
- Wydawca:
- Uniwersytet Przyrodniczo-Humanistyczny w Siedlcach
- Tematy:
-
genetic algorithm
inverse problem
microelectronics
thermal properties
layered structure - Opis:
- In the paper, possibilities of application of genetic algorithms to determine thermal properties depth profile in microelectronic layered structures were presented. A developed computational method was described and results obtained using the method for a thyristor structure were presented.
- Źródło:
-
Studia Informatica : systems and information technology; 2008, 1(10); 15-26
1731-2264 - Pojawia się w:
- Studia Informatica : systems and information technology
- Dostawca treści:
- Biblioteka Nauki
Artykuł