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Wyświetlanie 1-2 z 2
Tytuł:
Mechanically Stimulated Changes in Surface Electrical Conductivity of X-Irradiated Silicon Crystals
Autorzy:
Lys, Roman
Żyłka, Marta
Shykorjak, Josyp
Slobodzyan, Dmytro
Żyłka, Wojciech
Pavlyk, Bohdan
Powiązania:
https://bibliotekanauki.pl/articles/2201919.pdf
Data publikacji:
2023
Wydawca:
Stowarzyszenie Inżynierów i Techników Mechaników Polskich
Tematy:
X-ray irradiation
silicon
uniaxial deformation
dislocation
Opis:
Changes in the resistance of single crystals of p-type conductivity silicon under the action of mechanical loading were investigated in this research. Also, non-irradiated and pre-irradiated X-rays experimental samples were studied. It was found that at small deformation values when they are at the initial stage of the action of elastic deformation, a section forms and increases, on which the resistance practically does not depend on the applied mechanical load. In irradiated crystals, at small deformation values, electron generation processes dominate, which then recombine with the main carriers – holes. The consequence of such processes is the appearance of a maximum increase in electrical resistance at the initial stage of elastic deformation of experimental samples irradiated with X-rays. Charge carrier generation processes begin to dominate with further deformation. Such processes occur as a result of the release of acceptor centers from other complex defects, which are destroyed during the deformation of the Si crystal and captured by mobile dislocations. Thus, the processes of generation of charge carriers prevail over the processes of gettering and, accordingly, a mechano-stimulated decrease in the electrical resistance of p-Si samples occurs.
Źródło:
Advances in Science and Technology. Research Journal; 2023, 17, 2; 226--231
2299-8624
Pojawia się w:
Advances in Science and Technology. Research Journal
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Effect of Nanoindentation Rate on Plastic Deformation in Cu Thin Films
Autorzy:
Chocyk, Dariusz
Zientarski, Tomasz
Powiązania:
https://bibliotekanauki.pl/articles/2022488.pdf
Data publikacji:
2022
Wydawca:
Stowarzyszenie Inżynierów i Techników Mechaników Polskich
Tematy:
nanoindentation
stress distribution
dislocation
common neighbor analysis
molecular dynamics simulation
Cu
thin film
Opis:
The paper investigates the nanoindentation process with different rates in the Cu (001) of FCC system. The indentation process was done using molecular dynamics simulation based on the embedded atom method theory and Morse potential. Simulation process of indentation used a rigid spherical indenter with the diamond structure. To structure characterization we applied the adaptive common neighbour and the dislocation extraction analysis. It was found that the range of the linear change of the indentation force depends on the rate of response of the system. The initial range of the linear dependence of stress evolution also depends on the rate of indentation. Moreover, the average total normal stress in the system is only compressive. After linear changes, we observe oscillating changes in stress evolution. During indentation, for the range of linear changes of stress, dislocations aggregated only around the indenter surface. The creation of dislocations is directly connected with the structural changes. The structure analysis revealed the formation of HCP and BCC structure in the Cu (001) of FCC systems and a correlation with the creation of dislocations.
Źródło:
Advances in Science and Technology. Research Journal; 2022, 16, 1; 170-179
2299-8624
Pojawia się w:
Advances in Science and Technology. Research Journal
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-2 z 2

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