Autor: Majchrowski, K. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Appointing of surface topography parameters to describe the diffuse reflective properties of selected dielectrics
Autorzy:: Majchrowski, R.
Rozanski, L.
Grochalski, K.
Powiązania:: https://bibliotekanauki.pl/articles/114434.pdf
Data publikacji:: 2017
Wydawca:: Stowarzyszenie Inżynierów i Techników Mechaników Polskich
Tematy:: thermographic measurements
surface topography
emissivity
reflection
Opis:: The investigations have been performed in order to choose the specific roughness parameters, which would inform the customer about the diffuse emissive and reflective characteristics of the adhesive tapes used in the thermographic measurements. To achieve that, a series of the surface topography parameters of various adhesive tapes (i.e. objects with diffusive reflective characteristics) and various glass plates (i.e. objects with directional reflective characteristics) has been examined. For the analysis of surface topography the following parameters were selected: Sdr (the Developed Interfacial Area Ratio) and Sdq (the Root Mean Square Surface Slope). These selected parameters seem to be most suitable to describe the properties of the surface in the discussed aspect.
Źródło:: Measurement Automation Monitoring; 2017, 63, 3; 78-81
2450-2855
Pojawia się w:: Measurement Automation Monitoring
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: The Design Concept of the Laboratory Heater for Studying the Effect of Surface Topography to Emissivity
Autorzy:: Majchrowski, R.
Grochalski, K.
Rozanski, L.
Powiązania:: https://bibliotekanauki.pl/articles/114567.pdf
Data publikacji:: 2015
Wydawca:: Stowarzyszenie Inżynierów i Techników Mechaników Polskich
Tematy:: temperature control
PID control
laboratory heater
emissivity
surface topography
Opis:: Remote temperature sensing and thermal imaging systems [1, 2] are invaluable tools in various fields of science and technology. The fact that radiation is a function of object surface temperature makes it possible for remote temperature measurement systems to calculate this temperature. However, to measure temperature accurately with IR system, it is necessary to know emissivity. Emissivity is one of the major sources of error in radiometric measurements. Generally, emissivity is not constant as it depends on several parameters: temperature, viewing angle, wavelength, contamination or roughness. The article presents a laboratory heater which can be used to measure the thermal emissivity ε depending on the sample surface topography.
Źródło:: Measurement Automation Monitoring; 2015, 61, 6; 176-179
2450-2855
Pojawia się w:: Measurement Automation Monitoring
Dostawca treści:: Biblioteka Nauki

Artykuł

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