- Tytuł:
- Oval defects in crystals grown by MBE technique: study and methods of elimination abstract
- Autorzy:
-
Szerling, A.
Kosiel, K.
Płuska, M.
Ochalski, T. J.
Ratajczak, J. - Powiązania:
- https://bibliotekanauki.pl/articles/378453.pdf
- Data publikacji:
- 2004
- Wydawca:
- Sieć Badawcza Łukasiewicz - Instytut Technologii Elektronowej
- Opis:
- The paper is devoted to a group of macroscopic defects which may be found in epitaxial A3 B5 materials grown by MBE technique. Morphology, geometry and optical properties of defects were studied by means of several experimental methods. The experimental data have been compared with the information taken from literature concerning sources of the defects and causes of their appearance.
- Źródło:
-
Electron Technology : Internet Journal; 2004, 36, 6; 1-5
1897-2381 - Pojawia się w:
- Electron Technology : Internet Journal
- Dostawca treści:
- Biblioteka Nauki
Artykuł