- Tytuł:
- Surfaces of Electron-Emitting Glasses Studied by a Slow Positron Beam
- Autorzy:
-
Pliszka, D.
Gazda, M.
Kusz, B.
Trzebiatowski, K.
Karwasz, G. P.
Deng, W.
Brusa, R. S.
Zecca, A. - Powiązania:
- https://bibliotekanauki.pl/articles/2025748.pdf
- Data publikacji:
- 2001
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
71.60.+z
78.70.Bj - Opis:
- Semi-conducting glasses used for electron multipliers and microchannel plate devices are obtained by surface modification of Pb or Bi-reach silicon-based glasses. The reduced layer extends down to 200-500 nm, much more than the effective depth of the electron-emitting layer. By the use of slow-positron beam we monitor the structural changes undergoing in near-to-surface layers after isothermal annealing. The measurements suggest a possible correlation between secondary-electron emission coefficient and the Doppler-broadening S-parameter. On these samples there were also performed atomic force microscopy, secondary electron emission, differential scanning calorimetry, and electric conductivity measurements.
- Źródło:
-
Acta Physica Polonica A; 2001, 99, 3-4; 465-472
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł