- Tytuł:
- X-Ray Diffraction Study of CeT₂Al₁₀ (T = Ru, Os) at Low Temperatures and under Pressures
- Autorzy:
-
Kawamura, Y.
Hayashi, J.
Takeda, K.
Sekine, C.
Tanida, H.
Sera, M.
Nakano, S.
Tomita, T.
Takahashi, H.
Nishioka, T. - Powiązania:
- https://bibliotekanauki.pl/articles/1032713.pdf
- Data publikacji:
- 2017-04
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
- 61.50.Ks
- Opis:
- We have carried out a powder X-ray diffraction investigation on antiferromagnetic Kondo semiconductors CeRu₂Al₁₀ and CeOs₂Al₁₀ at low temperatures and under high pressures as well as the structural investigation on single crystal of these compounds. The results of powder X-ray studies of CeRu₂Al₁₀ and CeOs₂Al₁₀ indicate that these compounds do not have structural transition at its antiferromagnetic ordering temperature. The results of single crystal structural refinement indicate that the b-axis of this crystal structure is insensitive not only to pressure but also to temperature and that the effect of cooling to Ce-Ce distance for CeRu₂Al₁₀ is the same as that for CeOs₂Al₁₀.
- Źródło:
-
Acta Physica Polonica A; 2017, 131, 4; 988-990
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł