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Wyszukujesz frazę "Chen, H. Y." wg kryterium: Autor


Wyświetlanie 1-6 z 6
Tytuł:
Aluminum-Doped Zinc Oxide Thin Films Prepared by Sol-Gel and~RF Magnetron Sputtering
Autorzy:
Wu, G.
Chen, Y.
Lu, H.
Powiązania:
https://bibliotekanauki.pl/articles/1504062.pdf
Data publikacji:
2011-07
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
81.15.Cd
82.70.Gg
77.55.hf
Opis:
Zinc oxide (ZnO) thin films have become technologically important materials due to their wide range of electrical and optical properties. The characteristics can be further adjusted by adequate doping processes. In this paper, aluminum-doped zinc oxide thin films have been prepared on glass substrates using a sol-gel route and the radio-frequency magnetron sputtering process. The stoichiometry could be easily adjusted by controlling the nanosized precursor concentration and the thickness by dip-coating cycles. On the other hand, the mixed $N_2O//Ar$ plasma gas provided adequate N doping for the RF sputtering process. The results showed the low electrical resistivity of 21.5 Ω cm with the carrier concentration of - 3.21 × $10^{18} cm^{-3}$ for the n-type aluminium-doped zinc oxide film. They were 34.2 Ω cm and + 9.68 × $10^{16} cm^{-3}$ for the p-type aluminium-doped zinc oxide film. The optical transmittance has been as high as 85-90% in the 400-900 nm wavelength range. The aluminium-doped zinc oxide (2 at.% Al) films exhibited the hexagonal wurzite structure with (002) preferred crystal orientation. The electrical characteristics were depicted by the gradual increase in N and NO that occupy the oxygen vacancies.
Źródło:
Acta Physica Polonica A; 2011, 120, 1; 149-152
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Compositions of Al-Based Quasicrystals Interpreted by Cluster Formulae
Autorzy:
Chen, H.
Qiang, J.
Wang, Y.
Dong, C.
Powiązania:
https://bibliotekanauki.pl/articles/1372748.pdf
Data publikacji:
2014-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.44.Br
36.40.-c
71.20.Lp
Opis:
It is known previously that bulk metallic glass compositions satisfy cluster formulae $[cluster](glue atom)_{1, 3}$ of 24 valence electrons as deduced from our cluster-resonance model. In the present work, it is further shown that compositions of Al-based binary and ternary quasicrystals are also explained by 24-electron cluster formulae of the types $[icosahedron](glue atom)_{0, 1}$, where the icosahedral cluster is identified from a corresponding crystalline approximant according to dense atomic packing and cluster isolation criteria, and the glue atom site is either vacant for an icosahedral quasicrystal or equal to one for a decagonal quasicrystal. Ternary quasicrystals are formulated with the same formulae as their basic binary ones but the icosahedron shell sites are substituted by third elements. The 24-electron cluster formulae are then the chemical and electronic structural units of quasicrystals, mimicking the molecular formulae of chemical substances.
Źródło:
Acta Physica Polonica A; 2014, 126, 2; 446-448
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Positron Annilation Lifetime and Glass Transition Temperatures in $CO_2$ Sorption Polystyrene
Autorzy:
Jean, Y.
Chen, H.
Lee, L.
Yang, J.
Powiązania:
https://bibliotekanauki.pl/articles/1812530.pdf
Data publikacji:
2008-05
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.70.Bj
78.66.Qn
71.60.+z
Opis:
Positron annihilation lifetime spectroscopy was used to measure the free-volume size and distributions as a function of temperature in polystyrene with and without 400 psi $CO_2$ sorption. The transition temperatures in the polystyrene with $CO_2$ sorption obtained from ortho-positronium lifetimes were found to depend on the thermal cycles and a meta-stable state showing a negative thermal expansion coefficient was observed between 53°C and 82°C during the first heating up experiment. The observed $T_g$ in polystyrene with, and without $CO_2$ sorption after annealing from ortho-positronium lifetimes were found to be 86°C and 91°C, which are 5°C higher, and 10°C lower than from the differential scanning calorimetry data, respectively. The observed free-volume variations are discussed in terms of hole expansion, creation, free-volume relaxation, plasticization, and hole filling in amorphous polymers.
Źródło:
Acta Physica Polonica A; 2008, 113, 5; 1385-1395
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Microstructure and Magnetic Properties of Magnetron-Sputtered [Fe/Pt]ₙ Multilayer Films
Autorzy:
Zhang, Y.
Yu, W.
Chen, F.
Liu, M.
Li, H.
Powiązania:
https://bibliotekanauki.pl/articles/1401879.pdf
Data publikacji:
2015-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.55.Jk
75.50.Ss
Opis:
[Fe/Pt]ₙ multilayer films were prepared on thermally oxidized Si (100) substrates at 300°C using dc magnetron sputtering and annealed for different temperature ranging from 350 to 500°C. It is found that the as-deposited [Fe/Pt]ₙ multilayer films exhibit well-resolved periodic structures and low roughness of interface. The ordering degree of the annealed films decreases and their perpendicular magnetic anisotropy deteriorates with increasing the period number. Fe/Pt bilayer film annealed at 350°C shows (001) orientation and hard magnetic characteristic, the coercivity and perpendicular anisotropy enhance with increase of annealing temperature. In addition, the hard and soft magnetic phases are not fully magnetically coupled in the Fe/Pt film annealed at higher temperature.
Źródło:
Acta Physica Polonica A; 2015, 128, 3; 326-330
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Interface Engineering in Heteroepitaxy
Autorzy:
Hong, S. K.
Chen, Y.
Ko, H. J.
Yao, T.
Powiązania:
https://bibliotekanauki.pl/articles/2035571.pdf
Data publikacji:
2002
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.35.-p
68.35.Dv
81.15.-z
81.15.Hi
81.10.Aj
Opis:
We report the importance of interface engineering in heteroepitaxy with examples of plasma-assisted molecular beam epitaxial ZnO growths on (0001) sapphire substrates and on (0001) GaN/sapphire templates, whose interfaces are engineered to improve and to control properties of ZnO films. The growth of rocksalt structure MgO buffer on Al$\text{}_{2}$O$\text{}_{3}$ (0001) is developed for ZnO epitaxy. By employing the MgO buffer layer, the formation of 30$\text{}^{o}$ rotated mixed domains is prohibited and two-dimensional layer-by-layer growth of ZnO on sapphire substrate is achieved. High-resolution X-ray diffraction reveals the superior improvement in a crystal quality of ZnO films with an MgO buffer. Polarity of wurtzite structure ZnO films on Ga-polar GaN/sapphire templates is controlled by changing interface structures. By forming a single crystalline, monoclinic Ga$\text{}_{2}$O$\text{}_{3}$ interfacial layer between GaN and ZnO through O-plasma pre-exposure on the Ga-polar GaN surface, O-polar ZnO films are grown. By forming the ZnO/GaN heterointerface without an interfacial layer through the Zn pre-exposure on the Ga-polar GaN surface, Zn-polar ZnO films are grown.
Źródło:
Acta Physica Polonica A; 2002, 102, 4-5; 541-554
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Dislocation Generation and Propagation across the Seed in Seed Cast-Si Ingots
Autorzy:
Miyamura, Y.
Chen, J.
Prakash, R.
Jiptner, K.
Harada, H.
Sekiguchi, T.
Powiązania:
https://bibliotekanauki.pl/articles/1363535.pdf
Data publikacji:
2014-04
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
88.40.jj
81.10.Fq
61.72.Ff
61.72.Hh
61.72.Lk
Opis:
We have studied the dislocation generation and propagation from the seed crystals during seed cast Si growth. The grown ingot was cut into a vertical wafer, followed by the dislocation imaging using X-ray topography and Secco etching. The dislocation behavior at the seed area was compared with the dislocation generation at the top surface due to the thermal stress during cooling. The dislocations at the seed/crystal interface have propagated on the {111} plane toward top. When the seed surface was not melted sufficiently, the interface defect density became high, but no clear dislocation propagation was recognized. This suggests that the thermal shock at the seed/melt interface was not high enough to propagate dislocations to the growth direction. A certain amount of dislocations has been introduced from the top into the ingot according to the thermal stress. These observations suggest that optimizing the initial growth condition is important to dislocation control.
Źródło:
Acta Physica Polonica A; 2014, 125, 4; 1024-1026
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-6 z 6

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