- Tytuł:
- Image Depth Profiling AES
- Autorzy:
-
Sekine, T.
Sato, T. - Powiązania:
- https://bibliotekanauki.pl/articles/1892328.pdf
- Data publikacji:
- 1992-01
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
- 68.35.Dv
- Opis:
- Image depth profiling AES incorporating an image processing technique has been developed. This method reconstructs a cross-sectional image from acquired 2-dimensional and/or 3-dimensional data. A binary image produced from a secondary electron image through image processing can be used to cut the area of interest for selected area analysis. In a failure analysis of a relay contact, we found by cross-sectional image observation that Fe and Ni permeate from pin holes in an Au layer covering a Fe-Ni alloy. A VTR head made of a polycrystalline ferrite core covered with a Sendust (Si-Al-Fe alloy) layer at the gap has been analyzed. Depth distributions of Al, 0, and Fe on different grains, and Al and O distributions near grain boundaries have been successfully reassembled from the 3-dimensional data.
- Źródło:
-
Acta Physica Polonica A; 1992, 81, 1; 145-157
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł