- Tytuł:
- New Indicators Of Burnished Surface Evaluation – Reasons Of Application
- Autorzy:
-
Toboła, D.
Rusek, P.
Czechowski, K.
Miller, T.
Duda, K. - Powiązania:
- https://bibliotekanauki.pl/articles/221546.pdf
- Data publikacji:
- 2015
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
surface geometrical structure
slide diamond burnishing
correlation analysis
discrete Fourier transform - Opis:
- Modern production technology requires new ways of surface examination and a special kind of surface profile parameters. Industrial quality inspection needs to be fast, reliable and inexpensive. In this paper it is shown how stochastic surface examination and its proper parameters could be a solution for many industrial problems not necessarily related with smoothing out a manufactured surface. Burnishing is a modern technology widely used in aircraft and automotive industries to the products as well as to process tools. It gives to the machined surface high smoothness, and good fatigue and wear resistance. Every burnished material behaves in a different manner. Process conditions strongly influence the final properties of any specific product. Optimum burnishing conditions should be preserved for any manufactured product. In this paper we deal with samples made of conventional tool steel – Sverker 21 (X153CrMoV12) and powder metallurgy (P/M) tool steel – Vanadis 6. Complete investigations of product properties are impossible to perform (because of constraints related to their cost, time, or lack of suitable equipment). Looking for a global, all-embracing quality indicator it was found that the correlation function and the frequency analysis of burnished surface give useful information for controlling the manufacturing process and evaluating the product quality. We propose three new indicators of burnishing surface quality. Their properties and usefulness are verified with the laboratory measurement of material samples made of the two mentioned kinds of tool steel.
- Źródło:
-
Metrology and Measurement Systems; 2015, 22, 2; 263-274
0860-8229 - Pojawia się w:
- Metrology and Measurement Systems
- Dostawca treści:
- Biblioteka Nauki
Artykuł