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    Wyświetlanie 1-2 z 2
    Tytuł:
    Investigation of Different Transfer Functions for Optical Limiting Amplifier used in a 2R Burst Mode Optical Regenerator
    Autorzy:
    Deodhar, Yash
    Reddy, Jeeru Jaya Sankar
    Kakade, Priyanka Desai
    Kakade, Rohan
    Powiązania:
    https://bibliotekanauki.pl/articles/1844502.pdf
    Data publikacji:
    2021
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    optical limiting amplifier
    burst mode
    ASE noise
    nonlinearity
    bit error rate
    optical regeneration
    Opis:
    The major difference between a continuous mode optical regenerator (CMOR) and a burst mode optical regenerator (BMOR) is that a BMOR is capable of handling large variations in the input power which makes it useful in optical packet switched and optical burst switched networks. This is due to the optical limiting amplifier (OLA) present in the BMOR. Using computer modelling, the impact of using different OLA non-linear transfer functions on the output bit error rate of a system consisting of a cascade of 2R BMORs has been investigated. The effect of amplified spontaneous emission (ASE) noise introduced in the inter-regenerator links has also been taken into consideration. Also, a brief review of existing OLA designs is presented.
    Źródło:
    International Journal of Electronics and Telecommunications; 2021, 67, 3; 409-416
    2300-1933
    Pojawia się w:
    International Journal of Electronics and Telecommunications
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Disassembly-free metrological control of analog-to-digital converter parameters
    Autorzy:
    Bubela, Tetiana
    Kochan, Roman
    Więcław, Łukasz
    Yatsuk, Vasyl
    Kuts, Victor
    Yatsuk, Jurij
    Powiązania:
    https://bibliotekanauki.pl/articles/2173896.pdf
    Data publikacji:
    2022
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    metrological support
    analog-to-digital converter
    non-disassembly control
    cyber-physical system
    nonlinearity
    additive component of error
    ACE
    multiplicative component of error
    Opis:
    The authors update the issue disassembly-free control and correction of all components of the error of measuring channels with multi-bit analog-to-digital converters (ADCs). The main disadvantages of existing methods for automatic control of the parameters of multi-bit ADCs, in particular their nonlinearity, are identified. Methods for minimizing instrumental errors and errors caused by limited internal resistances of closed switches, input and output resistances of active elements are investigated. The structures of devices for determining the multiplicative and nonlinear components of the error of multi-bit ADCs based on resistive dividers built on single-nominal resistors are proposed and analyzed. The authors propose a method for the correction of additive, multiplicative and nonlinear components of the error at each of the specified points of the conversion range during non-disassembly control of the ADC with both types of inputs. The possibility of non-disassembly control, as well as correction of multiplicative and nonlinear components of the error of multi-bit ADCs in the entire range of conversion during their on-site control is proven. ADC error correction procedures are proposed. These procedures are practically invariant to the non-informative parameters of active structures with resistive dividers composed of single-nominal resistors. In the article the prospects of practical implementation of the method of error correction during non-dismantling control of ADC parameters using the possibilities provided by modern microelectronic components are shown. The ways to minimize errors are proposed and the requirements to the choice of element parameters for the implementation of the proposed technical solutions are given. It is proved that the proposed structure can be used for non-disassembly control of multiplicative and nonlinear components of the error of precision instrumentation amplifiers.
    Źródło:
    Metrology and Measurement Systems; 2022, 29, 4; 669--684
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-2 z 2

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