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Wyświetlanie 1-11 z 11
Tytuł:
Deposition Of Oxide And Intermetallic Thin Films By Pulsed Laser (PLD) And Electron Beam (PED) Methods
Osadzanie tlenkowych oraz międzymetalicznych cienkich filmów z wykorzystaniem lasera impulsowego (PLD) i wiązki elektronowej (PED)
Autorzy:
Kusiński, J.
Kopia, A.
Cieniek, Ł.
Kąc, S.
Radziszewska, A.
Powiązania:
https://bibliotekanauki.pl/articles/352325.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
PLD
PED
thin film
structure
doped oxides
cienki film
struktura
osadzanie
Opis:
In this work the pulsed laser deposition (PLD) and the pulsed electron beam deposition (PED) techniques were used for fabrication of Mo-Bi2O3, La1-xSrxCoO3, La1-xCaxCoO3 and Al-Mg thin films. An influence of ablation process basic parameters on the coatings structure and properties was discussed. Two types of laser ablation systems were applied: one equipped with a KrF excimer and second with a Q-switched Nd:YAG. Films were deposited on Si and MgO substrates. Scanning (SEM) and transmission (TEM) electron microscopy, atomic force microscopy (AFM) as well as X-ray diffraction (XRD) were used for structural analysis. Investigations focused on structure and chemical composition showed that smooth and dense thin films with nanocrystalline structure, preserving the composition of the bulk target, could be obtained by the both PLD and PED techniques. Research study showed that by a proper selection of PLD and PED process parameters it was possible to deposit films with significantly decreased amount and size of undesirably nanoparticulates.
Osadzanie laserem impulsowym (PLD) oraz osadzanie impulsową wiązka elektronową (PED) wykorzystane zostało do wytwarzania cienkich filmów typu: Mo-Bi2O3, La1-xSrxCoO3, La1-xCaxCoO3 and Al-Mg oraz Al-Mg. Dyskutowano wpływ podstawowych parametrów procesu ablacji na strukturę i właściwości uzyskiwanych powłok. Wykorzystane zostały dwa typy systemów do ablacji; jeden z ekscymerowym laserem KrF i drugi na bazie lasera Nd:YAG z modulatorem dobroci (Q-Switch). Filmy osadzano na podłożu Si i MgO. Skaningowa (SEM) i transmisyjna (TEM) mikroskopia elektronowa, mikroskopia sił atomowych (AFM), oraz dyfrakcja rentgenowska (XRD) wykorzystana została do analizy strukturalnej. Badania skoncentrowane na strukturze i składzie chemicznym wykazały jednorodną i zwartą budowę cienkich nanokrystalicznych filmów uzyskanych metodami PLD i PED utrzymujących skład odparowywanych tarcz. Wykazano doświadczalnie, że odpowiednie dobranie parametrów procesu pozwala otrzymywać filmy o istotnym zminimalizowaniu ilości i wymiarów niekorzystnych nanocząstek w powłoce.
Źródło:
Archives of Metallurgy and Materials; 2015, 60, 3; 2173-2182
1733-3490
Pojawia się w:
Archives of Metallurgy and Materials
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Improvement Optical and Electrical Characteristics of Thin Film Solar Cells Using Nanotechnology Techniques
Autorzy:
Thabet, Ahmed
Abdelhady, Safaa
Ebnalwaled, A.A.
Ibrahim, A. A.
Powiązania:
https://bibliotekanauki.pl/articles/226062.pdf
Data publikacji:
2019
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
thin film
nanoparticles
nanocomposites
energy conversion
optical
plasmonic
solar cells
Opis:
This work presents a theoretical study for the distribution of nanocomposite structure of plasmonic thin-film solar cells through the absorber layers. It can be reduced the material consumption and the cost of solar cell. Adding nanometallic fillers in the absorber layer has been improved optical, electrical characteristics and efficiency of traditional thin film solar cells (ITO /CdS/PbS/Al and SnO2/CdS/CdTe/Cu) models that using sub micro absorber layer. Also, this paper explains analysis of J-V, P-V and external quantum efficiency characteristics for nanocomposites thin film solar cell performance. Also, this paper presents the effect of increasing the concentration of nanofillers on the absorption, energy band gap and electron-hole generation rate of absorber layers and the effect of volume fraction on the energy conversion efficiency, fill factor, space charge region of the nanocomposites solar cells.
Źródło:
International Journal of Electronics and Telecommunications; 2019, 65, 4; 625-634
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Characterization of SnO2/TiO2 with the Addition of Polyethylene Glycol via Sol-Gel Method for Self-Cleaning Application
Autorzy:
Halin, Dewi Suriyani Che
Azliza, Azani
Razak, Kamrosni Abdul
Abdullah, Mohd Mustafa Al Bakri
Salleh, Mohd Arif Anuar Mohd
Wahab, Juyana A
Chobpattana, Varistha
Kaczmarek, Łukasz
Nabiałek, Marcin
Jeż, Bartłomiej
Powiązania:
https://bibliotekanauki.pl/articles/2203743.pdf
Data publikacji:
2023
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
TiO2
SnO2
thin film
polyethylene glycol
self-cleaning
Opis:
TiO2 is one of the most widely used metal oxide semiconductors in the field of photocatalysis for the self-cleaning purpose to withdraw pollutants. Polyethylene glycol (PEG) is recommended as a stabilizer and booster during preparation of water-soluble TiO2. Preparation of SnO2/TiO2 thin film deposition on the surface of ceramic tile was carried out by the sol-gel spin coating method by adding different amount of PEG (0g, 0.2g, 0.4g, 0.6g, 0.8g) during the preparation of the sol precursor. The effects of PEG content and the annealing temperature on the phase composition, crystallite size and the hydrophilic properties of SnO2/TiO2 films were studied. The X-ray diffraction (XRD) spectra revealed different phases existed when the films were annealed at different annealing temperatures of 350°C, 550°C and 750°C with 0.4 g of PEG addition. The crystallite sizes of the films were measured using Scherrer equation. It shows crystallite size was dependent on crystal structure existed in the films. The films with mixed phases of brookite and rutile shows the smallest crystallite size. In order to measure the hydrophilicity properties of films, the water contact angles for each film with different content of PEG were measured. It can be observed that the water contact angle decreased with the increasing of the content of PEG. It shows the superhydrophilicity properties for the films with the 0.8 g of PEG annealed at 750°C. This demonstrates that the annealed temperature and the addition of PEG affect the phase composition and the hydrophilicity properties of the films.
Źródło:
Archives of Metallurgy and Materials; 2023, 68, 1; 243--248
1733-3490
Pojawia się w:
Archives of Metallurgy and Materials
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Microstructural Studies of Ag/TiO2 Thin Film; Effect of Annealing Temperature
Autorzy:
Kamrosni, Abdul Razak
Dewi Suryani, Che Halin
Azliza, Azani
Mohd Mustafa Al Bakri, Abdullah
Mohd Arif Anuar, Mohd Salleh
Norsuria, Mahmed
Chobpattana, Varistha
Kaczmarek, L.
Jeż, Bartłomiej
Nabiałek, Marcin
Powiązania:
https://bibliotekanauki.pl/articles/2048839.pdf
Data publikacji:
2022
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
Ag/TiO2
annealing temperature
microstructure
optical properties
thin film
Opis:
Microstructures are an important link between materials processing and performance, and microstructure control is essential for any materials processing route where the microstructure plays a major role in determining the properties. In this work, silverdoped titanium dioxide (Ag/TiO2) thin film was prepared by the sol-gel method through the hydrolysis of titanium tetra-isopropoxide and silver nitrate solution. The sol was spin coated on ITO glass substrate to get uniform film followed by annealing process for 2 hours. The obtained films were annealed at different annealing temperatures in the range of 300°C-600°C in order to observe the effect on crystalline state, microstructures and optical properties of Ag/TiO2 thin film. The thin films were characterized by X-Ray diffraction (XRD), scanning electron microscopy (SEM), and UV-Vis spectrophotometry. It is clearly seen, when the annealing temperature increases to 500°C, a peak at 2θ = 25.30° can be seen which refers to the structure of TiO2 tetragonal anatase. The structure of Ag/TiO2 thin film become denser, linked together, porous and uniformly distributed on the surface and displays the highest cut-off wavelength value which is 396 nm with the lowest band gap value, which is 3.10 eV.
Źródło:
Archives of Metallurgy and Materials; 2022, 67, 1; 241-245
1733-3490
Pojawia się w:
Archives of Metallurgy and Materials
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Characteristics of GZO/IZO Dual-Layer as an Electron Transport Layer in Dye-Sensitized Solar Cell
Autorzy:
Manzari Tavakoli, M. H.
Ahmadi, M.
Sabet, M.
Powiązania:
https://bibliotekanauki.pl/articles/353232.pdf
Data publikacji:
2018
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
dual-layer
sol-gel
spin coating
thin film
GIZO
solar cell
Opis:
GZO/IZO semiconductor thin films were prepared on the ITO substrate via sol-gel spin coating method for using in the dye-sensitized solar cells (DSSCs). For this purpose, GZO and IZO thin films were optimized by the percentage of doping gallium and indium in zinc oxide and were studied their electrical, optical and structural properties. After that, the layers with the best performance were selected for use in the DSSCs. The concentration of all solutions for spin coating processes was 0.1 M and zinc oxide has been doped with gallium and indium, with different doping percentages (0, 0.5, 1, 2 and 4 volume percentage). So, by studying the properties of the fabricated thin films, it was found the films with 0.5%GZO and 0.5%IZO have the best performance and hence, the optimized dual-layer (0.5% GZO/0.5% IZO (GIZO)) were prepared and studied their electrical and optical properties. The synthesized optimized dual-layer film was successfully used as the working electrode for dye-sensitized solar cells. The sample with 0.5%IZO shows the 9.1 mA/cm2 short-circuit current density, 0.52 V open circuit voltage, 63% fill factor and 2.98% efficiency.
Źródło:
Archives of Metallurgy and Materials; 2018, 63, 4; 1609-1614
1733-3490
Pojawia się w:
Archives of Metallurgy and Materials
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Electrothermal Properties and RF Transmittance of Spray-coated CNT Thin Film for Radome De-icing Application
Autorzy:
Jung, Jun Hyuk
Hong, Jiwon
Kim, Youngryeul
Yong, Seok-Min
Park, Jinwoo
Lee, Seung Jun
Powiązania:
https://bibliotekanauki.pl/articles/351163.pdf
Data publikacji:
2020
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
De-icing
CNT thin film
spray coating
electrothermal property
RF transmittance
Opis:
Ice formed on radome surfaces causes communication disruption due to radio-frequency interference (RFI), which reveals the importance of de-icing systems for radomes. As a radome de-icing application, in this work, carbon nanotube (CNT) thin films were fabricated using a spray-coating method, and influence of process parameters on RF transmittance and electrothermal propertieswas investigated. With the increase of spraying time, sheet resistance of the fabricated film decreases, which results in a decrease of the RF transmittance and improvement of the heating performance. Also, the de-icing capability of the fabricated CNT film was evaluated at –20°C, and efficient removal of ice under cold conditions was demonstrated.
Źródło:
Archives of Metallurgy and Materials; 2020, 65, 3; 1011-1014
1733-3490
Pojawia się w:
Archives of Metallurgy and Materials
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Noise properties of thin-film Ni-P resistors embedded in printed circuit boards
Autorzy:
Stadler, A. W.
Zawiślak, Z.
Stęplewski, W.
Dziedzic, A.
Powiązania:
https://bibliotekanauki.pl/articles/201274.pdf
Data publikacji:
2013
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
thin-film resistors
Ni-P foil
1/f noise
low-frequency noise measurements
Opis:
Noise studies of planar thin-film Ni-P resistors made in/on Printed Circuit Boards, both covered with two different types of cladding or uncladded have been described. The resistors have been made of the resistive-conductive-material (Ohmega-Ply©) of 100 Ώ/sq. Noise of the selected pairs of samples has been measured in the DC resistance bridge with a transformer as the first stage in a signal path. 1/f noise caused by resistance fluctuations has been found to be the main noise component. Parameters describing noise properties of the resistors have been calculated and then compared with the parameters of other previously studied thin- and thick-film resistive materials.
Źródło:
Bulletin of the Polish Academy of Sciences. Technical Sciences; 2013, 61, 3; 731-735
0239-7528
Pojawia się w:
Bulletin of the Polish Academy of Sciences. Technical Sciences
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Optical and electrical properties of (Ti-V)Ox thin film as n-type Transparent Oxide Semiconductor
Autorzy:
Mazur, M.
Domaradzki, J.
Wojcieszak, D.
Powiązania:
https://bibliotekanauki.pl/articles/201406.pdf
Data publikacji:
2014
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
Transparent Oxide Semiconductor
Transparent Electronics
(Ti-V)Ox thin film
magnetron sputtering
optical and electrical properties
Opis:
In this paper, the influence of vanadium doping on optical and electrical properties of titanium dioxide thin films has been discussed. The (Ti-V)Ox thin films was deposited on silicon and Corning glass substrates using high energy reactive magnetron sputtering process. Measurements performed with the aid of x-ray diffraction revealed, that deposited thin film was composed of nanocrystalline mixture of TiO2-anatase, V2O3 and β-V2O5 phases. The amount of vanadium in the thin film, estimated on the basis of energy dispersive spectroscopy measurement, was equal to 3 at. %. Optical properties were evaluated based on transmission and reflection measurements. (Ti-V)Ox thin film was well transparent and the absorption edge was shifted by only 11 nm towards longer wavelengths in comparison to undoped TiO2. Electrical measurements revealed, that investigated thin film was transparent oxide semiconductors with n-type electrical conduction and resistivity of about 2.7 · 105 Ωcm at room temperature. Additionally, measured I-V characteristics of TOS-Si heterostructure were nonlinear and asymmetrical.
Źródło:
Bulletin of the Polish Academy of Sciences. Technical Sciences; 2014, 62, 3; 583-594
0239-7528
Pojawia się w:
Bulletin of the Polish Academy of Sciences. Technical Sciences
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Production and formation modelling of CaCO3 in multiphase reactions – A review
Autorzy:
Gierycz, Paweł
Poświata, Artur
Powiązania:
https://bibliotekanauki.pl/articles/2034048.pdf
Data publikacji:
2021
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
CaCO3 production
CaCO3 formation modelling
continues reactors
bubble column reactor
thin film reactor
produkcja CaCO3
modelowanie powstawania CaCO3
reaktor cienkowarstwowy
Opis:
The paper presents different approaches to the proper and accurate production and modelling (multi- phase reaction) of CaCO3 formation in the most popular, different types of reactors, i.e. continuous reactor (STR – stirred tank reactors, MSMPR – mixed suspension, mixed product removal; tube reactor), a bubble column reactor and a thin film reactor. Many different methods of calcium carbonate production and their effect on the various characteristics of the product have been presented and discussed. One of the most important, from the point of view of practical applications, is the morphology and size of the produced particles as well as their agglomerates and size distribution. The size of the obtained CaCO3 particles and their agglomerates can vary from nanometers to micrometers. It depends on many factors but the most important are the conditions calcium carbonate precipitation and then stored. The experimental research was strongly aided by theoretical considerations on the correct description of the process of calcium carbonate precipitation. More than once, the correct modelling of a specific process contributed to the explanation of the phenomena observed during the experiment (i.e. formation of polyforms, intermediate products, etc.). Moreover, different methods and approaches to the accurate description of crystallization processes as well as main CFD problems has been widely reviewed. It can be used as a basic material to formulation and implementation of new, accurate models describing not only multiphase crystallization processes but also any processes taking place in different chemical reactors.
Źródło:
Chemical and Process Engineering; 2021, 42, 1; 15-34
0208-6425
2300-1925
Pojawia się w:
Chemical and Process Engineering
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Fabrication Of YSZ Thin Film By Electrochemical Deposition Method And The Effect Of The Pulsed Electrical Fields For Morphology Control
Otrzymywanie cienkich warstw YSZ metodą osadzania elektrochemicznego oraz wpływ pulsacyjnych pól elektrycznych na kontrolę morfologii
Autorzy:
Fujita, T.
Saiki, A.
Hashizume, T.
Powiązania:
https://bibliotekanauki.pl/articles/356351.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
yittria stabilized zirconia
thin film
electrochemical deposition method
pulsed electrical field
morphology control
tlenek itru stabilizowany tlenkiem cyrkonu
cienka warstwa
metoda osadzania elektrochemicznego
pulsacyjne pole elektryczne
kontrola morfologii
Opis:
In this study, surface morphology control ions in a precursor solution and patterning the YSZ film has been carried out during deposition of thin film from a precursor solution by applying the electrical field for deposition and the pulsed electrical field. The precursor solution was mixed them of ZrO(NO3)4, Y(NO3)3-6H2O into deionized water, and then was controlled nearly pH3 by adding NH3(aq). The thin film was deposited on the glass substrate of the minus electrode side by applying the electrical field of 3.0 V for 20 min. In addition, another pulsed voltage was applied to the electrical field along the perdicular direction to the film deposition direction. After annealing samples at 773 K for 6 h in air, the film was crystallized and obtained YSZ film. In the limited condition, the linear patterns of YSZ films due to the frequency of the applied electrical field were observed. It is expected that ions in a precursor solution are controlled by applying the pulsed voltage and the YSZ film is patterned on the substrate.
W niniejszej pracy cienkie warstwy YSZ otrzymywano metodą elektrochemiczną z roztworu. Morfologia otrzymanej warstwy była kontrolowana poprzez zastosowanie pulsacyjnego pola elektrycznego. Roztwór prekursora otrzymano poprzez zmieszanie ZrO(NO3)4, Y(NO3)3-6H2O w wodzie dejonizowanej, przy czym pH roztworu było utrzymywane na stałym poziomie (pH = 3) poprzez dodawanie NH3(aq). Na podłoże szklane naniesiono cienką warstwę po stronie ujemnej elektrody przykładając pole elektryczne o napięciu 3,0 V przez 20 min. Dodatkowo, przyłożono napięcie pulsacyjne do pola elektrycznego w kierunku prostopadłym do kierunku nanoszenia warstwy. Po kalcynacji próbek w 773 K przez 6 godz. w powietrzu, warstwa uległa krystalizacji i otrzymano warstwę YSZ. W tych warunkach zaobserwowano liniowe odwzorowanie warstw YSZ spowodowane częstotliwością przyłożonego pola elektrycznego. Przypuszcza się, że przyłożone napięcie pulsacyjne kontroluje jony w roztworze prekursora, co wpływa na strukturę warstwy YSZ.
Źródło:
Archives of Metallurgy and Materials; 2015, 60, 2A; 945-948
1733-3490
Pojawia się w:
Archives of Metallurgy and Materials
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Dry And Ringer Solution Lubricated Tribology Of Thin Osseoconductive Metal Oxides And Diamond-Like Carbon Films
Tribologia suchych i smarowanych roztworem Ringera cienkich filmów na bazie tlenków metali i diamentopodobnych promujących procesy ostointegracyjne
Autorzy:
Waldhauser, W.
Lackner, J. M.
Kot, M.
Major, B.
Powiązania:
https://bibliotekanauki.pl/articles/351772.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
biotribology
thin films
lubrication
tribologia
cienki film
smarowanie
Opis:
Achieving fast and strong adhesion to jawbone is essential for dental implants. Thin deposited films may improve osseointegration, but they are prone to cohesive and adhesive fracture due to high stresses while screwing the implant into the bone, leading to bared, less osteoconductive substrate surfaces and nano- and micro-particles in the bone. Aim of this work is the investigation of the cohesion and adhesion failure stresses of osteoconductive tantalum, titanium, silicon, zirconium and aluminium oxide and diamond-like carbon films. The tribological behaviour under dry and lubricated conditions (Ringer solution) reveals best results for diamond-like carbon, while cohesion and adhesion of zirconium oxide films is highest.
Osiągnięcie szybkiego i trwałego przylegania powierzchni biomateriału do kości szczęki ma zasadnicze znaczenie dla implantów dentystycznych. Cienkie osadzone filmy mogą poprawić osteointegrację ale są podatne na kohezyjne i adhezyjne pękanie podczas wkręcania implantu do kości, prowadząc do odsłoniecia mniej osteokonduktywnych powierzchni podłoża oraz powodując tworzenie się nano- i mikro cząstek. Celem niniejszej pracy są badania naprężeń wywołujących defekty w osteointegracyjnych filmach na bazie tantalu, tytanu, cyrkonu oraz tlenku aluminium i diamentopodobnych. Tribologiczne najlepsze właściwości w warunkach suchych i smarowania (roztwór Ringera) wykazały powłoki diamentopodobne, natomiast spójność i przyczepność filmy z tlenku cyrkonu.
Źródło:
Archives of Metallurgy and Materials; 2015, 60, 3; 2139-2144
1733-3490
Pojawia się w:
Archives of Metallurgy and Materials
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-11 z 11

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