Autor: Mleczko, M. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Evaluation of methods for the detection of low-abundant snoRNA-derived small RNAs in Saccharomyces cerevisiae
Autorzy:: Walkowiak, M.
Mleczko, A.M.
Bakowska-Zywicka, K.
Powiązania:: https://bibliotekanauki.pl/articles/80556.pdf
Data publikacji:: 2016
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Źródło:: BioTechnologia. Journal of Biotechnology Computational Biology and Bionanotechnology; 2016, 97, 1
0860-7796
Pojawia się w:: BioTechnologia. Journal of Biotechnology Computational Biology and Bionanotechnology
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Noise Properties of Graphene-Polymer Thick-Film Resistors
Autorzy:: Mleczko, K.
Ptak, P.
Zawiślak, Z.
Słoma, M.
Jakubowska, M.
Kolek, A.
Powiązania:: https://bibliotekanauki.pl/articles/220754.pdf
Data publikacji:: 2017
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:: graphene
polymer thick-film resistor
low-frequency noise
noise measurements
Opis:: Graphene is a very promising material for potential applications in many fields. Since manufacturing technologies of graphene are still at the developing stage, low-frequency noise measurements as a tool for evaluating their quality is proposed. In this work, noise properties of polymer thick-film resistors with graphene nano-platelets as a functional phase are reported. The measurements were carried out in room temperature. 1/f noise caused by resistance fluctuations has been found to be the main component in the specimens. The parameter values describing noise intensity of the polymer thick-film specimens have been calculated and compared with the values obtained for other thick-film resistors and layers used in microelectronics. The studied polymer thick-film specimens exhibit rather poor noise properties, especially for the layers with a low content of the functional phase.
Źródło:: Metrology and Measurement Systems; 2017, 24, 4; 589-594
0860-8229
Pojawia się w:: Metrology and Measurement Systems
Dostawca treści:: Biblioteka Nauki

Artykuł

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