Informacja

Drogi użytkowniku, aplikacja do prawidłowego działania wymaga obsługi JavaScript. Proszę włącz obsługę JavaScript w Twojej przeglądarce.

Wyszukujesz frazę "gallium" wg kryterium: Temat


Wyświetlanie 1-7 z 7
Tytuł:
Gallium oxide buffer layers for gallium nitride epitaxy
Autorzy:
Korbutowicz, R
Wnek, J
Panachida, P
Serafinczuk, J
Srnanek, R
Powiązania:
https://bibliotekanauki.pl/articles/174303.pdf
Data publikacji:
2013
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
hydride vapour phase epitaxy
gallium nitride
gallium oxide
thermal oxidation
buffer layer
Opis:
Gallium nitride (GaN) is very attractive semiconductor material because of its unique properties. The serious matter is a lack of easy access to bulk crystals of GaN. Synthesized crystals are precious and rather small. For these reasons almost all device manufacturers and researchers apply alternative substrates for gallium nitride devices epitaxy and it causes that the technology is intricate. Alternative substrates need buffer layers – their technology is usually complex and expensive. We have proposed a simple method to avoid large costs: applying gallium oxide – monoclinic β-Ga2O3, as the buffer layer, which has structural properties quite good matched to GaN. As the substrates made from single crystal gallium oxide are still hardly available on the market, we have used hydride vapour phase epitaxy (HVPE) GaN epilayers as a starting material. It can be GaN layer under good quality – middle or low. The oxidation process converts top GaN to β-Ga2O3 layer which can release or absorb the strain. Applying such structure in another, second, epitaxy of GaN allows to obtain good quality epitaxial structures using HVPE technique.
Źródło:
Optica Applicata; 2013, 43, 1; 73-79
0078-5466
1899-7015
Pojawia się w:
Optica Applicata
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Optimization of p-type contacts to InGaN-based laser diodes and light emitting diodes grown by plasma assisted molecular beam epitaxy
Autorzy:
Nowakowski-Szkudlarek, Krzesimir
Muziol, Grzegorz
Żak, Mikolaj
Hajdel, Mateusz
Siekacz, Marcin
Feduniewicz-Żmuda, Anna
Skierbiszewski, Czesław
Powiązania:
https://bibliotekanauki.pl/articles/173471.pdf
Data publikacji:
2020
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
gallium nitride
molecular beam epitaxy
contacts
Opis:
We investigated the influence of the In0.17Ga0.83N:Mg contact layer grown by plasma assisted molecular beam epitaxy on the resistivity of p-type Ni/Au contacts. We demonstrate that the Schottky barrier width for p-type contact is less than 5 nm. We compare circular transmission line measurements with a p-n diode current-voltage characteristics and show that discrepancies between these two methods can occur if surface quality is deteriorated. It is found that the most efficient contacts to p-type material consist of In0.17Ga0.83N:Mg contact layer with Mg doping levelas high as 2 × 1020 cm–3.
Źródło:
Optica Applicata; 2020, 50, 2; 323-330
0078-5466
1899-7015
Pojawia się w:
Optica Applicata
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Beneficiation of Ga from alunite concentrates by selective acid leaching and alkaline precipitation
Autorzy:
Zhu, Mao-Lan
Chen, Hang
Zhong, Shui-Ping
Huang, Zhong-Sheng
Chen, Xi
Hu, Zhi-Biao
Powiązania:
https://bibliotekanauki.pl/articles/110733.pdf
Data publikacji:
2019
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
gallium
selective leaching
precipitation
alunite concentrate
Opis:
In this study beneficiation of Ga from alunite ore was investigated. The effects of the calcination temperature, H2SO4 concentration, leaching temperature and liquid-solid ratio on the dissolution characteristic of Ga, K and Al were studied. The results showed that increasing the calcination temperature, H2SO4 concentration and leaching temperature can improve the solubility of K and Al. However, higher H2SO4 concentration and lower leaching temperature can improve the dissolution of Ga, which was beneficial to recovery of Ga. On the basis of the solubility difference in H2SO4, a two-stage process of selective acid leaching and alkali precipitation of Ga was proposed. The concentration of Ga was increased significantly from 54 g/t in alunite ore to 4100 g/t in alkali precipitation product. The major elements of Al and K in alunite were recovered as the alum crystal with a purity of 99.62%.
Źródło:
Physicochemical Problems of Mineral Processing; 2019, 55, 4; 1028-1038
1643-1049
2084-4735
Pojawia się w:
Physicochemical Problems of Mineral Processing
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Behavior of gallium and germanium associated with zinc sulfide concentrate in oxygen pressure leaching
Autorzy:
Liu, F.
Liu, Z.
Li, Y.
Wilson, B. P.
Lundstrom, M.
Powiązania:
https://bibliotekanauki.pl/articles/110812.pdf
Data publikacji:
2017
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
zinc sulfide concentrate
gallium
germanium
pyrite
oxygen pressure leaching
Opis:
The Fankou zinc concentrate (Guangdong province, China) was mineralogically characterized and results showed that the main germanium-bearing minerals in the sample comprised of zinc sulfide and galena, whereas gallium-bearing minerals were pyrite, sphalerite and silicate. Oxygen pressure leaching of zinc sulfide concentrate was carried out in order to investigate the effect of pressure, leaching time, sulfuric acid and copper concentrations on the leaching behavior of gallium and germanium. Under optimum conditions, leaching of Zn, Fe, Ge and Ga reached 98.21, 90.45, 97.45 and 96.65%, respectively. In the leach residues, it was determined that some new precipitates, such as PbSO4, CaSO4 and SiO2, were formed, which co-precipitated a certain amount of Ga and Ge from the leach solution. The results clearly indicated that Ga and Ge were much more difficult to leach than Zn, and provided answers to why the leaching efficiency of Ga is 10% lower when compared to Ge.
Źródło:
Physicochemical Problems of Mineral Processing; 2017, 53, 2; 1047-1060
1643-1049
2084-4735
Pojawia się w:
Physicochemical Problems of Mineral Processing
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Active Damping in Series Connected Power Modules with Continuous Output Voltage
Autorzy:
Ulmer, Sabrina
Schullerus, Gernot
Sönmez, Ertugrul
Powiązania:
https://bibliotekanauki.pl/articles/1955969.pdf
Data publikacji:
2021
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
power electronics
modularity
scalability
GaN
gallium nitride
active filter damping
Opis:
This paper presents a modular and scalable power electronics concept for motor control with continuous output voltage. In contrast to multilevel concepts, modules with continuous output voltage are connected in series. The continuous output voltage of each module is obtained by using gallium nitride (GaN) high electron motility transistor (HEMT)s as switches inside the modules with a switching frequency in the range between 500 kHz and 1 MHz. Due to this high switching frequency a LC filter is integrated into the module resulting in a continuous output voltage. A main topic of the paper is the active damping of this LC output filter for each module and the analysis of the series connection of the damping behaviour. The results are illustrated with simulations and measurements.
Źródło:
Power Electronics and Drives; 2021, 6, 41; 314-335
2451-0262
2543-4292
Pojawia się w:
Power Electronics and Drives
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Two-dimensional modeling of surface photovoltage in metal/insulator/n-GaN structure with cylindrical symmetry
Autorzy:
Matys, M
Powroznik, P
Kupka, D
Adamowicz, B
Powiązania:
https://bibliotekanauki.pl/articles/174326.pdf
Data publikacji:
2013
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
surface photovoltage
gallium nitride
metal-insulator-semiconductor (MIS) structure
interface states
photodetector
Opis:
The rigorous numerical analysis of the surface photovoltage (SPV) versus excitation UV-light intensity (Φ), from 104 to 1020 photon/(cm2s) in a metal/insulator/n-GaN structure with a negative gate voltage (VG = –2 V) was performed using a finite element method. In the simulations we assumed a continuous U-shape density distribution function Dit(E) of the interface states and n-type doping concentration ND = 1016 cm–3. The SPV signal was calculated and compared in three different characteristic regions at the interface, namely i) under the gate centre, ii) near the gate edge and iii) between the gate and ohmic contact. We attributed the differences in SPV(Φ) dependences to the influence of the interface states in terms of the initial band bending and interface recombination controlled by the gate bias. The obtained results are useful for the design of GaN-based UV-radiation photodetectors.
Źródło:
Optica Applicata; 2013, 43, 1; 47-52
0078-5466
1899-7015
Pojawia się w:
Optica Applicata
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Refractive index and salinity sensors by gallium-doped zinc oxide thin film coated on side-polished fibers
Autorzy:
Tien, Chuen-Lin
Mao, Hao-Sheng
Mao, Tzu-Chi
Powiązania:
https://bibliotekanauki.pl/articles/1835762.pdf
Data publikacji:
2021
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
refractive index
thin film
side-polished fiber
lossy mode resonance
gallium-doped zinc oxide
Opis:
This work presents a high-sensitivity refractive index and salinity sensor by using fiber-optic side-polishing and electron-beam evaporation techniques. Thin film coated on the flat surface of side-polished fibers can generate a lossy mode resonance (LMR) effect. A gallium-doped zinc oxide (GZO) thin film was prepared by an electron-beam evaporation with the ion assisted deposition method. The residual thickness of the side-polished fiber was 76.5 μm, and GZO film thickness of 69 nm was deposited on the flat surface of the side-polished fiber to fabricate LMR-based fiber sensors. The variation in the optical spectrum of LMR-based fiber sensors was measured by different refractive index saline solutions. The LMR wavelength shift is caused by the refractive index change, which is nearly proportional to the salinity. The corresponding sensitivity of the proposed fiber-optic sensor was 3059 nm/RIU (refractive index unit) for the refractive index range of 1.333 to 1.398. To evaluate the sensitivity of LMR salinity sensors, the saline solution salinities of 3.6%, 7.3%, 10.9%, 14.6%, 18.2% and 21.9% were measured in this work. The experimental result shows that the sensitivity of the proposed salinity sensor is 9.94 nm/%.
Źródło:
Optica Applicata; 2021, 51, 1; 23-36
0078-5466
1899-7015
Pojawia się w:
Optica Applicata
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-7 z 7

    Ta witryna wykorzystuje pliki cookies do przechowywania informacji na Twoim komputerze. Pliki cookies stosujemy w celu świadczenia usług na najwyższym poziomie, w tym w sposób dostosowany do indywidualnych potrzeb. Korzystanie z witryny bez zmiany ustawień dotyczących cookies oznacza, że będą one zamieszczane w Twoim komputerze. W każdym momencie możesz dokonać zmiany ustawień dotyczących cookies