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Wyszukujesz frazę "scanning probe microscopy" wg kryterium: Wszystkie pola


Wyświetlanie 1-2 z 2
Tytuł:
Analysis of the electrolytically polished skeletal dentures surfaces using various nano- and microscopic technologies
Autorzy:
Dąbrowa, Tomasz
Majstrzyk, Wojciech
Tamulewicz, Magdalena
Piasecki, Tomasz
Kunicki, Piotr
Więckiewicz, Włodzimierz
Gotszalk, Teodor
Powiązania:
https://bibliotekanauki.pl/articles/306706.pdf
Data publikacji:
2019
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
chropowatość powierzchni
skaningowa mikroskopia elektronowa
proteza ruchoma
mikroskopia skaningowa
surface roughness
scanning electron microscopy
removable partial denture
scanning probe microscopy
optical profilometry
Opis:
The surface roughness of the dental restorations is significant to the denture plaque adhesion. Methods: In this work, we present the complex analysis of the electropolished CoCrW alloy remanium® star (Dentaurum, Germany) samples with laserengraved fiducial marks performed using complementary set of micro- and nanoscopic techniques: optical profilometry (OP), atomic force microscopy (AFM), scanning electron microscopy (SEM) and focused ion beam (FIB) milling. Results: Both mean and RMS roughness of the samples were reduced by electopolishing process, however, the results obtained using OP and AFM exhibited some discrepancies. This was caused by the relatively high local protruding defects developed on the processed surface. The cross-sections of the protrusions were made to analyze the cause of their formation as the EDS elemental content maps revealed that their composition was uniform. We also analyzed the local roughness in the smaller areas free from the defects. Conclusions: In that case, both OP and AFM techniques delivered the same results. Analysis of results showed that various methods used for the surface roughness evaluation have to be used simultaneously to obtain complete and true analysis of the technological CoCrW samples.
Źródło:
Acta of Bioengineering and Biomechanics; 2019, 21, 4; 123-129
1509-409X
2450-6303
Pojawia się w:
Acta of Bioengineering and Biomechanics
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
A simple model of the scanning near-field optical microscopy probe tip for electric field enhancement
Autorzy:
Wang, Y.
Cai, W.
Yang, M.
Liu, Z.
Shang, G.
Powiązania:
https://bibliotekanauki.pl/articles/174091.pdf
Data publikacji:
2017
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
near-field tip
electromagnetic field enhancement
finite-difference time-domain
FDTD
Opis:
In this paper, we present a simple near-field probe model that is composed of an elongated ellipsoid and a finite metal truncated cone. The elongated ellipsoid has been shown to act as a protrusion or separate particle near a truncated cone apex with strong near-field enhancement under laser excitation. By controllably varying the length of the ellipsoid protrusion from the truncated cone, the truncated cone-ellipsoid probes can be adapted to the suitability of near-field probes. The effects of substrate material and excitation wavelength on the near field enhancement for different tip apexes are also discussed. In addition, we compared the properties of the truncated cone-ellipsoid probe with the widely used hemisphere conical tip by launching surface plasmon polaritons on plasmonic waveguides to prove the suitability of the truncated cone-ellipsoid probes as high performance near-field probes. The present simple model would provide a theoretical basis for the actual construction of probes.
Źródło:
Optica Applicata; 2017, 47, 1; 119-130
0078-5466
1899-7015
Pojawia się w:
Optica Applicata
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-2 z 2

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