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    Wyświetlanie 1-4 z 4
    Tytuł:
    Model of a sliding gate controlled by a PLC driver
    Autorzy:
    Majcher, Jacek
    Powiązania:
    https://bibliotekanauki.pl/articles/376511.pdf
    Data publikacji:
    2019
    Wydawca:
    Politechnika Poznańska. Wydawnictwo Politechniki Poznańskiej
    Tematy:
    PLC
    sliding gate
    visualisation
    Opis:
    Due to low costs, PLC controllers are used not only in technological processes but also in everyday life. The article presents the possibility of using a PLC controller to control the operation of a sliding gate. For this purpose, a design was created and a sliding gate model made controlled with a Siemens S7-1200 PLC controller. This model is used to develop various gate control algorithms, especially for appropriate gate protection against crushing or uncontrolled closing. In addition, this model is connected via the Internet to a stand equipped with the SCADA application. The iFix 5.8 PL application was used to visualise the operation of the door, which, by means of a communication driver, allows the elevator operation to be controlled remotely. In addition, elements are shown in a graphic way, whereby it is possible to assess the position of the gate.
    Źródło:
    Poznan University of Technology Academic Journals. Electrical Engineering; 2019, 99; 191-199
    1897-0737
    Pojawia się w:
    Poznan University of Technology Academic Journals. Electrical Engineering
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Study of electro-thermal stress of IGBT devices
    Autorzy:
    Shaban, M. A.
    Ettomi, Y.
    Powiązania:
    https://bibliotekanauki.pl/articles/377956.pdf
    Data publikacji:
    2013
    Wydawca:
    Politechnika Poznańska. Wydawnictwo Politechniki Poznańskiej
    Tematy:
    electro-thermal stress
    IGBT
    Insulated Gate Bipolar Transistor
    Opis:
    The aim of this paper is to present a new approach which consists to correlate or coupled the functional and electrical stress with temperature. This approach can be extremely useful in the predicting the stressing effect and the impact of IXGH-IGBT I-V characteristics on circuit degradation. Moreover, this new approach significantly improves such parameters likes (threshold voltage Vth, collector saturation current, the stress and enhanced collector leakage current) and provides new capability for use this power device IXGH-IGBT in an actual circuit environment and modules. We also explain the physical reasons behind the improvement obtained using functional electrical stress on the IGBTs for IXYS constructor with temperature. Moreover, the forward blocking capability of IXGH-IGBT under a coupled Functional - Electro stress at high temperature was analyzed using simulation. This paper gives a straight comparison in term of the stress for improving the switching speed of IGBT device. This study is essential to ensure product reliability and to the evaluation of hot carrier reliability in the early stages. Furthermore, our reliability study permits us to improve the implantation of the device in a circuit, as well as its use in industrial operating conditions. The need for good simulator (Spice, Spice) to carry out a reliability study is pointed out in this paper.
    Źródło:
    Poznan University of Technology Academic Journals. Electrical Engineering; 2013, 76; 275-284
    1897-0737
    Pojawia się w:
    Poznan University of Technology Academic Journals. Electrical Engineering
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Communication model of measuring points using a RFID gate in production logistics
    Autorzy:
    Łobaziewicz, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/409338.pdf
    Data publikacji:
    2017
    Wydawca:
    Politechnika Poznańska. Wydawnictwo Politechniki Poznańskiej
    Tematy:
    selective RFID gate
    measuring points
    production system
    data management
    Opis:
    An infrastructure of modem production systems is based on technologically advanced machines and devices. One of the important issues in this aspect is to ensure the smooth communication among elements of the industrial automation infrastructure to ensure the quality, stability and safety of a production system as well as the right identification of resources using in production processes. The article presents a model of communication between measuring points in a production system with the use of a selective RFID gate as a result of R&D project made by DataConsult Sp. o.o. The model can be scaled and applied in different manufacturing companies. It is based on the assumption of parallel and independent communication on a configuration of industrial automation components that enable to use advanced and safety solutions of data collection, processing and sharing.
    Źródło:
    Research in Logistics & Production; 2017, 7, 4; 377-385
    2083-4942
    2083-4950
    Pojawia się w:
    Research in Logistics & Production
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    FPGA realization of an improved alpha max plus beta min algorithm
    Autorzy:
    Czyżak, M.
    Smyk, R.
    Powiązania:
    https://bibliotekanauki.pl/articles/376709.pdf
    Data publikacji:
    2014
    Wydawca:
    Politechnika Poznańska. Wydawnictwo Politechniki Poznańskiej
    Tematy:
    square root computation
    alpha max plus beta min algorithm
    field programmable gate array (FPGA)
    Opis:
    The improved version of the alpha max plus beta min square-rooting algorithm and its realization in the Field Programmable Gate Array (FPGA) are presented. The algorithm computes the square root to calculate the approximate magnitude of a complex sample. It is especially useful for pipelined calculations in the DSP. The improved version allows to reduce the peak error from about 4% to 0.33%. This is attained by determination of the approximate ratio of arguments and adequate selection of algorithm coefficients. Four approximation regions are used and hence four sets of coefficients. Also a Xilinx FPGA implementation for 12-bit sign magnitude numbers is shown.
    Źródło:
    Poznan University of Technology Academic Journals. Electrical Engineering; 2014, 80; 151-160
    1897-0737
    Pojawia się w:
    Poznan University of Technology Academic Journals. Electrical Engineering
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-4 z 4

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