- Tytuł:
- Second order reflection from crystals used in soft X-ray spectroscopy
- Autorzy:
- Książek, I.
- Powiązania:
- https://bibliotekanauki.pl/articles/146093.pdf
- Data publikacji:
- 2015
- Wydawca:
- Instytut Chemii i Techniki Jądrowej
- Tematy:
-
soft X-ray
plasma spectroscopy
PbSt
KAP - Opis:
- In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.
- Źródło:
-
Nukleonika; 2015, 60, 2; 263-265
0029-5922
1508-5791 - Pojawia się w:
- Nukleonika
- Dostawca treści:
- Biblioteka Nauki
Artykuł