- Tytuł:
- Electrical characterization of ISFETs
- Autorzy:
-
Tomaszewski, D.
Yang, C. M.
Jaroszewicz, B.
Zaborowski, M.
Grabiec, P.
Pijanowska, D. - Powiązania:
- https://bibliotekanauki.pl/articles/308663.pdf
- Data publikacji:
- 2007
- Wydawca:
- Instytut Łączności - Państwowy Instytut Badawczy
- Tematy:
-
ISFET
CMOS
electrical measurements
I-V characteristics
characterization
parameters extraction - Opis:
- Methodology of electrical characterization of ISFETs has been described. It is based on a three-stage approach. First, electrical measurements of ISFET-like MOSFETs and extraction of basic parameters of the MOSFET compact model are performed. Next, mapping of the ISFET channel conductances and a number of other characteristic parameters is carried out using a semi-automatic testing setup. Finally, ISFET sensitivity to solution pH is evaluated. The methodology is applied to characterize ISFETs fabricated in the Institute of Electron Technology (IET).
- Źródło:
-
Journal of Telecommunications and Information Technology; 2007, 3; 55-60
1509-4553
1899-8852 - Pojawia się w:
- Journal of Telecommunications and Information Technology
- Dostawca treści:
- Biblioteka Nauki
Artykuł