- Tytuł:
- The influence of yield model parameters on the probability of defect occurrence
- Autorzy:
-
Rakowski, M.
Pleskacz, W. A. - Powiązania:
- https://bibliotekanauki.pl/articles/308643.pdf
- Data publikacji:
- 2007
- Wydawca:
- Instytut Łączności - Państwowy Instytut Badawczy
- Tematy:
-
yield model parameters
spot defect
probability of defect occurrence
critical area - Opis:
- This paper describes the analysis of the influence of yield loss model parameters on the calculation of the probability of arising shorts between conducting paths in IC's. The characterization of the standard cell in AMS 0.8 žm CMOS technology is presented as well as obtained probability results and estimations of yield loss by changing values of model parameters.
- Źródło:
-
Journal of Telecommunications and Information Technology; 2007, 3; 101-104
1509-4553
1899-8852 - Pojawia się w:
- Journal of Telecommunications and Information Technology
- Dostawca treści:
- Biblioteka Nauki
Artykuł