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Wyszukujesz frazę "Liu, Y.-T." wg kryterium: Autor


Wyświetlanie 1-3 z 3
Tytuł:
Deflectometry for phase retrieval using a composite fringe
Autorzy:
Liu, T.
Zhou, C.
Liu, Y
Si, S
Lei, Z.
Powiązania:
https://bibliotekanauki.pl/articles/173892.pdf
Data publikacji:
2014
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
wavefront measurement
fringe analysis
phase retrieval
fast Fourier transform (FFT)
multifrequency heterodyne principle
Opis:
An improved deflectometry for wavefront measurement using a composite fringe is proposed to reduce the projection fringes and improve the accuracy. The single composite fringe contains four fringes in different directions. It goes through the tested objects and then is captured by a CCD camera. Two high frequency orthogonal fringe patterns and two single period orthogonal fringe patterns can be obtained from the composite fringe by fast Fourier transform. The unwrapping of the wrapped phase of the high frequency fringe is accomplished by the corresponding single period fringe using a heterodyne method. The wavefront is reconstructed by the integration of partial derivatives. Using only one fringe, the proposed method is more applicable to dynamic wavefront measurement. The experimental results demonstrate that the proposed method can retrieve the complex wavefronts more accurately.
Źródło:
Optica Applicata; 2014, 44, 3; 451-461
0078-5466
1899-7015
Pojawia się w:
Optica Applicata
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Wavelength-adjustable all-optical wavelength conversion using a tunable fiber laser and an electroabsorption modulator
Autorzy:
Tseng, C.-L.
Lin, Y.-W.
Ching, P.-J.
Cheng, Y.-T.
Jou, J.-J.
Liu, C.-K.
Powiązania:
https://bibliotekanauki.pl/articles/174311.pdf
Data publikacji:
2016
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
wavelength conversion
fiber ring laser
erbium-doped fiber
electroabsorption modulator
wavelength division multiplexing (WDM) network
Opis:
A wavelength conversion scheme is presented experimentally using a wavelength tunable erbium-doped fiber laser as a probe light source and an electroabsorption modulator with a DC bias only.For the input wavelength of 1557nm with a 10-Gb/s non-return to zero signal, the Q value is 10.6and the power penalty is less than 1.5dB at a bit error rate of 10–9 at the probe wavelength of1560nm. Given a fixed Q value of 6, probe wavelengths cover a range of 25nm. Furthermore,the relationship between the range of probe wavelength and the amount of power penalty is alsoinvestigated.
Źródło:
Optica Applicata; 2016, 46, 3; 347-352
0078-5466
1899-7015
Pojawia się w:
Optica Applicata
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Mitigation scratch on fused silica optics using CO2 laser
Autorzy:
Liu, C.-M.
Yan, Z.-H.
Yang, L.
Jiang, Y.
Zu, X.-T.
Wang, H.-J.
Liao, W.
Yuan, X.-D.
Zheng, W.-G.
Powiązania:
https://bibliotekanauki.pl/articles/174978.pdf
Data publikacji:
2016
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
mitigation
scratch
fused silica
CO2 laser
Opis:
The scratch on a fused silica surface was treated as a chain of connected damage sites and mitigated one after another using CO2 laser irradiation. The optical microscopy image shows that a scratch with the width of about 30 μm and length of several millimeters can be completely mitigated without the formation of debris and bubbles. The mitigated scratch can survive under raster scan laser irradiation with the fluency increased up to 11.0J/cm2 at 3ns and 351nm. On the contrary, the substrate without CO2 laser mitigation is seriously damaged under this irradiation. The light modulation induced by mitigation is much smaller when the scratch is mitigated before being damaged. The light modulation is about 2 when the distance to the mitigated sample is larger than 20cm. The birefringence induced by residual stress in the mitigated scratch is measured. The retardance of the mitigated scratch before being damaged is not visible. Therefore, residual stress in this mitigated scratch before being damaged should be not a critical potential risk in laser damage.
Źródło:
Optica Applicata; 2016, 46, 3; 387-397
0078-5466
1899-7015
Pojawia się w:
Optica Applicata
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-3 z 3

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