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    Wyświetlanie 1-7 z 7
    Tytuł:
    Improved Accuracy of Damage Index Evaluation in Concrete Structures by Simultaneous Hardware Triggering
    Autorzy:
    Lamonaca, F.
    Carrozzini, A.
    Grimaldi, D.
    Olivito, R. S.
    Powiązania:
    https://bibliotekanauki.pl/articles/221422.pdf
    Data publikacji:
    2014
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    acoustic emission
    multi-triggering
    non-destructive techniques
    Opis:
    Non-invasive damage monitoring of concrete structures by means of Acoustic Emission (AE) requires multitransducers, multi-channel acquisition, high sampling frequency and long observation time. Owing to its propagation in concrete, the signal from AE reduces its amplitude during the propagation, and, consequently, some events can be lost due to lower signal intensity than the trigger level set on one sensor only. The innovative proposal discussed in the paper consists in the introduction of a Flat Amplifier and Trigger generator block (FAT) in order to generate a logical trigger when the AE is detected by any transducer. Experimental tests confirm the effectiveness of the FAT to acquire all the AE events and to increase the evaluation accuracy of damage indexes.
    Źródło:
    Metrology and Measurement Systems; 2014, 21, 2; 341-350
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    A comparison between profile and areal surface roughness parameters
    Autorzy:
    He, Baofeng
    Ding, Siyuan
    Shi, Zhaoyao
    Powiązania:
    https://bibliotekanauki.pl/articles/1849009.pdf
    Data publikacji:
    2021
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    profile surface roughness
    areal surface roughness
    filtration techniques
    evaluation parameters
    Opis:
    Surface roughness has an important influence on the service performance and life of parts. Areal surface roughness has the advantage of accurately and comprehensively characterizing surface microtopography. Understanding the relationship and distinction between profile and areal surface roughness is conducive to deepening the study of areal surface roughness and improving its application. In this paper, the concepts, development, and applications of surface roughness in the profile and the areal are summarized from the aspect of evaluation parameters. The relationships and differences between surface roughness in the profile and the areal are analyzed for each aspect, and future development trends are identified.
    Źródło:
    Metrology and Measurement Systems; 2021, 28, 3; 413-438
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    A comparison between profile and areal surface roughness parameters
    Autorzy:
    He, Baofeng
    Ding, Siyuan
    Shi, Zhaoyao
    Powiązania:
    https://bibliotekanauki.pl/articles/1849053.pdf
    Data publikacji:
    2021
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    profile surface roughness
    areal surface roughness
    filtration techniques
    evaluation parameters
    Opis:
    Surface roughness has an important influence on the service performance and life of parts. Areal surface roughness has the advantage of accurately and comprehensively characterizing surface microtopography. Understanding the relationship and distinction between profile and areal surface roughness is conducive to deepening the study of areal surface roughness and improving its application. In this paper, the concepts, development, and applications of surface roughness in the profile and the areal are summarized from the aspect of evaluation parameters. The relationships and differences between surface roughness in the profile and the areal are analyzed for each aspect, and future development trends are identified.
    Źródło:
    Metrology and Measurement Systems; 2021, 28, 3; 413-438
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    A comparison between profile and areal surface roughness parameters
    Autorzy:
    He, Baofeng
    Ding, Siyuan
    Shi, Zhaoyao
    Powiązania:
    https://bibliotekanauki.pl/articles/1849106.pdf
    Data publikacji:
    2021
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    profile surface roughness
    areal surface roughness
    filtration techniques
    evaluation parameters
    Opis:
    Surface roughness has an important influence on the service performance and life of parts. Areal surface roughness has the advantage of accurately and comprehensively characterizing surface microtopography. Understanding the relationship and distinction between profile and areal surface roughness is conducive to deepening the study of areal surface roughness and improving its application. In this paper, the concepts, development, and applications of surface roughness in the profile and the areal are summarized from the aspect of evaluation parameters. The relationships and differences between surface roughness in the profile and the areal are analyzed for each aspect, and future development trends are identified.
    Źródło:
    Metrology and Measurement Systems; 2021, 28, 3; 413-438
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Separation of isochromatics and isoclinics phasemaps for the photoelastic technique with use phase shifting and a large number of high precision images
    Autorzy:
    Magalhaes, C. A.
    Neto, P. S.
    Magalhaes Jr P. A., A.
    de Barcellos, C. S.
    Powiązania:
    https://bibliotekanauki.pl/articles/220820.pdf
    Data publikacji:
    2013
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    photoelasticity
    metrology
    stress analysis
    strain measurement
    optical measurement systems
    optical interferometry
    experimental techniques
    Opis:
    Digital photoelasticity is an important optical metrology follow-up for stress and strain analysis using full-field digital photographic images. Advances in digital image processing, data acquisition, procedures for pattern recognition and storage capacity enable the use of the computer-aided technique in automation and facilitate improvement of the digital photoelastic technique. The objective of this research is to find new equations for a novel phase-shifting method in digital photoelasticity. Some innovations are proposed. In terms of phaseshifting, only the analyzer is rotated, and the other equations are deduced by applying a new numerical technique instead of the usual algebraic techniques. This approach can be used to calculate a larger sequence of images. Each image represents a pattern and a measurement of the stresses present in the object. A decrease in the mean errors was obtained by increasing the number of observations. A reduction in the difference between the theoretical and experimental values of stresses was obtained by increasing the number of images in the equations for calculating phase. Every photographic image has errors and random noise, but the uncertainties due to these effects can be reduced with a larger number of observations. The proposed method with many images and high accuracy is a good alternative to the photoelastic techniques.
    Źródło:
    Metrology and Measurement Systems; 2013, 20, 1; 127-138
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Comparative studies of the optical absorption coefficient spectra in the implanted layers in silicon with the use of nondestructive spectroscopic techniques
    Autorzy:
    Dorywalski, Krzysztof
    Chrobak, Łukasz
    Maliński, Mirosław
    Powiązania:
    https://bibliotekanauki.pl/articles/221542.pdf
    Data publikacji:
    2020
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    silicon
    ion implantation
    optical absorption coefficient spectra
    modulated free carrier absorption
    photo thermal radiometry
    ellipsometry
    nondestructive techniques
    Opis:
    This work presents results of comparative studies of the optical absorption coefficient spectra of ion implanted layers in silicon. Three nondestructive and noncontact techniques were used for this purpose: spectroscopic ellipsometry (SE), modulated free carriers absorption (MFCA) and the photo thermal radiometry (PTR). Results obtained with the ellipsometric method are the proof of correctness of the results obtained with the MFCA and PTR techniques. These techniques are usually used for investigations of recombination parameters of semiconductors. They are not used for investigations of the optical parameters of semiconductors. Optical absorption coefficient spectra of Fe+ and Ge+ high energy and dose implanted layers in silicon, obtained with the three techniques, are presented and compared.
    Źródło:
    Metrology and Measurement Systems; 2020, 27, 2; 323-337
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Chosen Aspects Of Investigations Of Solar Cells With The Laser Beam Induced Current Technique
    Autorzy:
    Chrobak, Ł. B.
    Madej, W. R.
    Maliński, M. A.
    Powiązania:
    https://bibliotekanauki.pl/articles/220416.pdf
    Data publikacji:
    2015
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    nondestructive techniques
    laser beam induced current
    photovoltaics
    silicon
    solar cells
    I-V characteristics
    optical absorption coefficient spectra
    Opis:
    This paper presents maps of spatial distributions of the short circuit current Isc(x,y) and the open circuit voltage Uoc(x,y) of the investigated low cost solar cells. Visible differences in values of these parameters were explained by differences in the serial and shunt resistances determined for different points of solar cells from measurements of I–V characteristics. The spectral dependence of the photo voltage of solar cell is also shown, discussed and interpreted in the model of amorphous and crystal silicon.
    Źródło:
    Metrology and Measurement Systems; 2015, 22, 2; 241-250
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-7 z 7

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