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Wyszukujesz frazę "sensor calibration" wg kryterium: Temat

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    Wyświetlanie 1-4 z 4
    Tytuł:
    A study on the calibration of an HPM meter based on a D-dot sensor and logarithmic RF power detector
    Autorzy:
    Jakubowski, Jacek
    Powiązania:
    https://bibliotekanauki.pl/articles/1849151.pdf
    Data publikacji:
    2020
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    HPM measurements
    sensor calibration
    RF detector
    D-dot sensor
    Opis:
    HPM meters are required for the assessment of fields generated by sources of high-power microwaves. Finding the inverse calibration curves for such instruments is important for ensuring accuracy. The procedure is relatively simple for meters consisting of linear devices but there can also be hardware solutions implementing nonlinear ones. The objective of the present work was to develop a convenient procedure to allow finding such a curve when the meter uses a D-dot probe and a power detector. For that purpose, the results of low voltage measurements describing the properties of the detector were first analysed. Then a software code was developed to estimate the RMS value of an incident field based on measured output and frequency response. The response was estimated with very low electric field. And finally, the performance of the proposed procedure was verified by tests conducted with high electric field in a TEM cell. High conformity of the output of the meter with fields of known values was demonstrated. The maximum error related to the meter range did not exceed 4%.
    Źródło:
    Metrology and Measurement Systems; 2020, 27, 4; 673-685
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Hardware techniques for improving the calibration performance of direct resistive sensor-to-microcontroller interface
    Autorzy:
    Kokolanski, Z.
    Gavrovski, C.
    Dimcev, V.
    Makraduli, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/221499.pdf
    Data publikacji:
    2013
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    passive sensor
    sensor interface
    calibration
    microcontroller
    Opis:
    Direct sensor-to-microcontroller is a simple approach for direct interface of passive modulating sensors to a microcontroller without any active components in between the sensor and the microcontroller and without an analog to digital converter. The metrological performances of such interface circuits are limited by certain microcontroller parameters which are predetermined by the manufacturing technology. These limitations can be improved by specific hardware-related techniques and can improve the accuracy, speed and resolution of the measurements. Such hardware solutions as well as proper selection of the electrical components are addressed in this paper. It has been shown that employment of only a few MOSFET transistors can reduce the maximal relative error of single point calibration more than fifteen times and can increase the measuring speed around 30 % in all calibration techniques in the measurement range of PT1000 resistive temperature sensors. Moreover, the effective number of resolution bits increases by more than 1.3 bits when using an external comparator.
    Źródło:
    Metrology and Measurement Systems; 2013, 20, 4; 529-542
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Sensor Calibration Design Based on D-Optimality Criterion
    Autorzy:
    Hajiyev, C.
    Powiązania:
    https://bibliotekanauki.pl/articles/220607.pdf
    Data publikacji:
    2016
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    sensor
    calibration curve
    calibration design
    D-optimality criterion
    least squares method
    Opis:
    In this study, a procedure for optimal selection of measurement points using the D-optimality criterion to find the best calibration curves of measurement sensors is proposed. The coefficients of calibration curve are evaluated by applying the classical Least Squares Method (LSM). As an example, the problem of optimal selection for standard pressure setters when calibrating a differential pressure sensor is solved. The values obtained from the D-optimum measurement points for calibration of the differential pressure sensor are compared with those from actual experiments. Comparison of the calibration errors corresponding to the D-optimal, A-optimal and Equidistant calibration curves is done.
    Źródło:
    Metrology and Measurement Systems; 2016, 23, 3; 413-424
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Metrological Analysis Of Microsoft Kinect In The Context Of Object Localization
    Autorzy:
    Skalski, A.
    Machura, B.
    Powiązania:
    https://bibliotekanauki.pl/articles/221384.pdf
    Data publikacji:
    2015
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    Kinect motion sensor
    localization
    camera calibration
    measurement precision
    robustness
    Opis:
    This paper presents a comprehensive metrological analysis of the Microsoft Kinect motion sensor performed using a proprietary flat marker. The designed marker was used to estimate its position in the external coordinate system associated with the sensor. The study includes calibration of the RGB and IR cameras, parameter identification and image registration. The metrological analysis is based on the data corrected for sensor optical distortions. From the metrological point of view, localization errors are related to the distance of an object from the sensor. Therefore, the rotation angles were determined and an accuracy assessment of the depth maps was performed. The analysis was carried out for the distances from the marker in the range of 0.8-1.65 m. The maximum average error was equal to 23 mm for the distance of 1.6 m.
    Źródło:
    Metrology and Measurement Systems; 2015, 22, 4; 469-478
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-4 z 4

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