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    Wyświetlanie 1-2 z 2
    Tytuł:
    Noise Properties of Graphene-Polymer Thick-Film Resistors
    Autorzy:
    Mleczko, K.
    Ptak, P.
    Zawiślak, Z.
    Słoma, M.
    Jakubowska, M.
    Kolek, A.
    Powiązania:
    https://bibliotekanauki.pl/articles/220754.pdf
    Data publikacji:
    2017
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    graphene
    polymer thick-film resistor
    low-frequency noise
    noise measurements
    Opis:
    Graphene is a very promising material for potential applications in many fields. Since manufacturing technologies of graphene are still at the developing stage, low-frequency noise measurements as a tool for evaluating their quality is proposed. In this work, noise properties of polymer thick-film resistors with graphene nano-platelets as a functional phase are reported. The measurements were carried out in room temperature. 1/f noise caused by resistance fluctuations has been found to be the main component in the specimens. The parameter values describing noise intensity of the polymer thick-film specimens have been calculated and compared with the values obtained for other thick-film resistors and layers used in microelectronics. The studied polymer thick-film specimens exhibit rather poor noise properties, especially for the layers with a low content of the functional phase.
    Źródło:
    Metrology and Measurement Systems; 2017, 24, 4; 589-594
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Noise Measurements Of Resistors With The Use Of Dual-Phase Virtual Lock-In Technique
    Autorzy:
    Stadler, A. W.
    Kolek, A.
    Zawiślak, Z.
    Dziedzic, A.
    Powiązania:
    https://bibliotekanauki.pl/articles/221468.pdf
    Data publikacji:
    2015
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    1/f noise
    polymer thick-film resistor
    low-frequency noise measurements
    virtual lock-in
    Opis:
    Measurement of low-frequency noise properties of modern electronic components is a very demanding challenge due to the low magnitude of a noise signal and the limit of a dissipated power. In such a case, an ac technique with a lock-in amplifier or the use of a low-noise transformer as the first stage in the signal path are common approaches. A software dual-phase virtual lock-in (VLI) technique has been developed and tested in low-frequency noise studies of electronic components. VLI means that phase-sensitive detection is processed by a software layer rather than by an expensive hardware lock-in amplifier. The VLI method has been tested in exploration of noise in polymer thick-film resistors. Analysis of the obtained noise spectra of voltage fluctuations confirmed that the 1/f noise caused by resistance fluctuations is the dominant one. The calculated value of the parameter describing the noise intensity of a resistive material, C= 1·10−21m3, is consistent with that obtained with the use of a dc method. On the other hand, it has been observed that the spectra of (excitation independent) resistance noise contain a 1/f component whose intensity depends on the excitation frequency. The phenomenon has been explained by means of noise suppression by impedances of the measurement circuit, giving an excellent agreement with the experimental data.
    Źródło:
    Metrology and Measurement Systems; 2015, 22, 4; 503-512
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-2 z 2

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