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    Wyświetlanie 1-5 z 5
    Tytuł:
    Automatic Measurement System for Determination of Leakage Flow Rate in Compressed Air Pipeline System
    Autorzy:
    Dindorf, R.
    Wos, P.
    Powiązania:
    https://bibliotekanauki.pl/articles/221382.pdf
    Data publikacji:
    2018
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    compressed air system
    leakage flow rate
    automatic measuring system
    Opis:
    A new method of indirect flow rate measurement in a pneumatic pipeline system was developed by the authors. The method enables to measure the controlled leakage in a branch line and was used to construct automatic measuring systems auditing the compressed air systems (CAS) piping. In the CAS audit the volume and cost of the leakage in a compressed air pipeline system is evaluated. Based on the authors’ patent, an automatic measuring system (AMS) for measurement of the leakage flow rate in industrial compressed air system piping, was developed. The AMS consists of a measurement device (MD) and a control system (CS). In the measurement device (MD) a novel bifunctional pneumatic proportional control valve is used. The AMS system will be used in the new research project “Mobile laboratory of compressed air system audit” based on the authors’ concept.
    Źródło:
    Metrology and Measurement Systems; 2018, 25, 1; 159-170
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Leakage Current Degradation Due to Ion Drift and Diffusion in Tantalum and Niobium Oxide Capacitors
    Autorzy:
    Kuparowitz, M.
    Sedlakova, V.
    Grmela, L.
    Powiązania:
    https://bibliotekanauki.pl/articles/221515.pdf
    Data publikacji:
    2017
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    niobium oxide capacitors
    tantalum capacitors
    leakage current
    ion diffusion
    ion drift
    Opis:
    High temperature and high electric field applications in tantalum and niobium capacitors are limited by the mechanism of ion migration and field crystallization in a tantalum or niobium pentoxide insulating layer. The study of leakage current (DCL) variation in time as a result of increasing temperature and electric field might provide information about the physical mechanism of degradation. The experiments were performed on tantalum and niobium oxide capacitors at temperatures of about 125°C and applied voltages ranging up to rated voltages of 35 V and 16 V for tantalum and niobium oxide capacitors, respectively. Homogeneous distribution of oxygen vacancies acting as positive ions within the pentoxide layer was assumed before the experiments. DCL vs. time characteristics at a fixed temperature have several phases. At the beginning of ageing the DCL increases exponentially with time. In this period ions in the insulating layer are being moved in the electric field by drift only. Due to that the concentration of ions near the cathode increases producing a positively charged region near the cathode. The electric field near the cathode increases and the potential barrier between the cathode and insulating layer decreases which results in increasing DCL. However, redistribution of positive ions in the insulator layer leads to creation of a ion concentration gradient which results in a gradual increase of the ion diffusion current in the direction opposite to the ion drift current component. The equilibrium between the two for a given temperature and electric field results in saturation of the leakage current value. DCL vs. time characteristics are described by the exponential stretched law. We found that during the initial part of ageing an exponent n = 1 applies. That corresponds to the ion drift motion only. After long-time application of the electric field at a high temperature the DCL vs. time characteristics are described by the exponential stretched law with an exponent n = 0.5. Here, the equilibrium between the ion drift and diffusion is achieved. The process of leakage current degradation is therefore partially reversible. When the external electric field is lowered, or the samples are shortened, the leakage current for a given voltage decreases with time and the DCL vs. time characteristics are described by the exponential stretched law with an exponent n = 0.5, thus the ion redistribution by diffusion becomes dominant.
    Źródło:
    Metrology and Measurement Systems; 2017, 24, 2; 255-264
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    An evaluation method of observable charge trap depth for the PEA method and its complementarity with the Q(t) method
    Autorzy:
    Ren, Hanwen
    Takada, Tatsuo
    Tanaka, Yasuhiro
    Li, Qingmin
    Powiązania:
    https://bibliotekanauki.pl/articles/1848995.pdf
    Data publikacji:
    2021
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    pulsed electroacoustic method
    trap depth
    current integration charge method
    leakage current
    Opis:
    This paper proposes an evaluation method for the observable trap depth range of space charge when using the pulsed electro-acoustic (PEA) method and its complementarity with the current integration charge (Q(t)) method. Based on the measurement process of the PEA method and the hopping conduction principle of space charge, the relationship between the trap depth and the residence time of charge is analysed. A method to analyse the effect of the measurement speed and the spatial resolution of the PEA system on the observable trap depth is then proposed. Further results show when the single measurement time needs 1 s and the resolution is 10 μm at room temperature, the corresponding trap depth is larger than 0.68 eV. Meanwhile, under high temperature or with voltage applied, the depth can further increase. The combined measurement results of the PEA and Q(t) methods indicate that the former focuses on charge distribution in deep traps, which allows to calculate the distorted electric field. The latter can measure the changing process of the total charge involved in all traps, which is applicable to analysing the leakage current. Therefore, the evaluation of HVDC insulation properties based on the joint application of the two methods is more reliable.
    Źródło:
    Metrology and Measurement Systems; 2021, 28, 3; 565-580
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    An evaluation method of observable charge trap depth for the PEA method and its complementarity with the Q(t) method
    Autorzy:
    Ren, Hanwen
    Takada, Tatsuo
    Tanaka, Yasuhiro
    Li, Qingmin
    Powiązania:
    https://bibliotekanauki.pl/articles/1849041.pdf
    Data publikacji:
    2021
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    pulsed electroacoustic method
    trap depth
    current integration charge method
    leakage current
    Opis:
    This paper proposes an evaluation method for the observable trap depth range of space charge when using the pulsed electro-acoustic (PEA) method and its complementarity with the current integration charge (Q(t)) method. Based on the measurement process of the PEA method and the hopping conduction principle of space charge, the relationship between the trap depth and the residence time of charge is analysed. A method to analyse the effect of the measurement speed and the spatial resolution of the PEA system on the observable trap depth is then proposed. Further results show when the single measurement time needs 1 s and the resolution is 10 μm at room temperature, the corresponding trap depth is larger than 0.68 eV. Meanwhile, under high temperature or with voltage applied, the depth can further increase. The combined measurement results of the PEA and Q(t) methods indicate that the former focuses on charge distribution in deep traps, which allows to calculate the distorted electric field. The latter can measure the changing process of the total charge involved in all traps, which is applicable to analysing the leakage current. Therefore, the evaluation of HVDC insulation properties based on the joint application of the two methods is more reliable.
    Źródło:
    Metrology and Measurement Systems; 2021, 28, 3; 565-580
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    An evaluation method of observable charge trap depth for the pea method and its complementarity with the Q(t) method
    Autorzy:
    Ren, Hanwen
    Takada, Tatsuo
    Tanaka, Yasuhiro
    Li, Qingmin
    Powiązania:
    https://bibliotekanauki.pl/articles/1849058.pdf
    Data publikacji:
    2021
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    pulsed electroacoustic method
    trap depth
    current integration charge method
    leakage current
    Opis:
    This paper proposes an evaluation method for the observable trap depth range of space charge when using the pulsed electro-acoustic (PEA) method and its complementarity with the current integration charge (Q(t)) method. Based on the measurement process of the PEA method and the hopping conduction principle of space charge, the relationship between the trap depth and the residence time of charge is analysed. A method to analyse the effect of the measurement speed and the spatial resolution of the PEA system on the observable trap depth is then proposed. Further results show when the single measurement time needs 1 s and the resolution is 10 μm at room temperature, the corresponding trap depth is larger than 0.68 eV. Meanwhile, under high temperature or with voltage applied, the depth can further increase. The combined measurement results of the PEA and Q(t) methods indicate that the former focuses on charge distribution in deep traps, which allows to calculate the distorted electric field. The latter can measure the changing process of the total charge involved in all traps, which is applicable to analysing the leakage current. Therefore, the evaluation of HVDC insulation properties based on the joint application of the two methods is more reliable.
    Źródło:
    Metrology and Measurement Systems; 2021, 28, 3; 565-580
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-5 z 5

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