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    Wyświetlanie 1-5 z 5
    Tytuł:
    Dynamic tilt testing of MEMS inclinometers based on conical motions
    Autorzy:
    Yang, Qihang
    Cai, Chenguang
    Yang, Ming
    Kong, Ming
    Liu, Zhihua
    Liang, Feng
    Powiązania:
    https://bibliotekanauki.pl/articles/2203364.pdf
    Data publikacji:
    2023
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    MEMS inclinometer
    sensitivity
    dynamic testing
    conical motion
    angle drift
    Opis:
    The MEMS inclinometer integrates a tri-axis accelerometer and a tri-axis gyroscope to solve the perceived dynamic inclinations through a complex data fusion algorithm, which has been widely used in the fields of industrial, aerospace, and monitoring. In order to ensure the validity of the measurement results of MEMS inclinometers, it is necessary to determine their dynamic performance parameters. This study proposes a conical motion-based MEMS inclinometer dynamic testing method, and the motion includes the classical conical motion, the attitude conical motion, and the dual-frequency conical motion. Both the frequency response and drift angle of MEMS inclinometers can be determined. Experimental results show that the conical motions can accelerate the angle drift of MEMS inclinometers, which makes them suitable for dynamic testing of MEMS inclinometers. Additionally, the tilt sensitivity deviation of the MEMS inclinometer by the proposed method and the turntable-based method is less than 0.26 dB. We further provide the research for angle drift and provide discussion.
    Źródło:
    Metrology and Measurement Systems; 2023, 30, 1; 31--47
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    A Statistical Approach To Prediction Of The CMM Drift Behaviour Using A Calibrated Mechanical Artefact
    Autorzy:
    Cuesta, E.
    Alvarez, B.
    Sanchez-Lasheras, F.
    Gonzalez-Madruga, D.
    Powiązania:
    https://bibliotekanauki.pl/articles/221090.pdf
    Data publikacji:
    2015
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    multivariate regression models
    coordinate measuring machine
    drift behaviour
    calibration
    Opis:
    This paper presents a multivariate regression predictive model of drift on the Coordinate Measuring Machine (CMM) behaviour. Evaluation tests on a CMM with a multi-step gauge were carried out following an extended version of an ISO evaluation procedure with a periodicity of at least once a week and during more than five months. This test procedure consists in measuring the gauge for several range volumes, spatial locations, distances and repetitions. The procedure, environment conditions and even the gauge have been kept invariables, so a massive measurement dataset was collected over time under high repeatability conditions. A multivariate regression analysis has revealed the main parameters that could affect the CMM behaviour, and then detected a trend on the CMM performance drift. A performance model that considers both the size of the measured dimension and the elapsed time since the last CMM calibration has been developed. This model can predict the CMM performance and measurement reliability over time and also can estimate an optimized period between calibrations for a specific measurement length or accuracy level.
    Źródło:
    Metrology and Measurement Systems; 2015, 22, 3; 417-428
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Active Stabilization of the Beam Pointing of a High- Power KrF Laser System
    Autorzy:
    Barna, A.
    Földes, I. B.
    Bohus, J.
    Szatmári, S.
    Powiązania:
    https://bibliotekanauki.pl/articles/221761.pdf
    Data publikacji:
    2015
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    diffraction-limited UV pulse
    beam-pointing stabilization
    long-term drift
    photodiode
    Opis:
    An active beam-pointing stabilization system has been developed for a high-power KrF laser system to eliminate the long-term drift of the directional change of the beam in order to have a stable focusing to a high intensity. The control of the beam direction was achieved by a motor-driven mirror activated by an electric signal obtained by monitoring the position of the focus of the output beam. Instead of large sized UV-sensitive position sensitive detectors a simple arrangement with scatter plates and photodiodes are used to measure the directionality of the beam. After the beam stabilization the long-term residual deviation of the laser shots is ~14 μrad, which is comparable to the shot-to-shot variation of the beam (~12 μrad). This deviation is small enough to keep the focal spot size in a micrometer range when tightly focusing the beam using off-axis parabolic mirrors.
    Źródło:
    Metrology and Measurement Systems; 2015, 22, 1; 165-172
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Leakage Current Degradation Due to Ion Drift and Diffusion in Tantalum and Niobium Oxide Capacitors
    Autorzy:
    Kuparowitz, M.
    Sedlakova, V.
    Grmela, L.
    Powiązania:
    https://bibliotekanauki.pl/articles/221515.pdf
    Data publikacji:
    2017
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    niobium oxide capacitors
    tantalum capacitors
    leakage current
    ion diffusion
    ion drift
    Opis:
    High temperature and high electric field applications in tantalum and niobium capacitors are limited by the mechanism of ion migration and field crystallization in a tantalum or niobium pentoxide insulating layer. The study of leakage current (DCL) variation in time as a result of increasing temperature and electric field might provide information about the physical mechanism of degradation. The experiments were performed on tantalum and niobium oxide capacitors at temperatures of about 125°C and applied voltages ranging up to rated voltages of 35 V and 16 V for tantalum and niobium oxide capacitors, respectively. Homogeneous distribution of oxygen vacancies acting as positive ions within the pentoxide layer was assumed before the experiments. DCL vs. time characteristics at a fixed temperature have several phases. At the beginning of ageing the DCL increases exponentially with time. In this period ions in the insulating layer are being moved in the electric field by drift only. Due to that the concentration of ions near the cathode increases producing a positively charged region near the cathode. The electric field near the cathode increases and the potential barrier between the cathode and insulating layer decreases which results in increasing DCL. However, redistribution of positive ions in the insulator layer leads to creation of a ion concentration gradient which results in a gradual increase of the ion diffusion current in the direction opposite to the ion drift current component. The equilibrium between the two for a given temperature and electric field results in saturation of the leakage current value. DCL vs. time characteristics are described by the exponential stretched law. We found that during the initial part of ageing an exponent n = 1 applies. That corresponds to the ion drift motion only. After long-time application of the electric field at a high temperature the DCL vs. time characteristics are described by the exponential stretched law with an exponent n = 0.5. Here, the equilibrium between the ion drift and diffusion is achieved. The process of leakage current degradation is therefore partially reversible. When the external electric field is lowered, or the samples are shortened, the leakage current for a given voltage decreases with time and the DCL vs. time characteristics are described by the exponential stretched law with an exponent n = 0.5, thus the ion redistribution by diffusion becomes dominant.
    Źródło:
    Metrology and Measurement Systems; 2017, 24, 2; 255-264
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Statistical process control of commercial force-sensing resistors
    Autorzy:
    Palacio Gómez, Carlos Andrés
    Paredes-Madrid, Leonel
    Garzon, Andrés Orlando
    Powiązania:
    https://bibliotekanauki.pl/articles/2173875.pdf
    Data publikacji:
    2022
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    force sensing resistors
    FSR
    pressure sensor
    statistical process control
    hysteresis error
    drift error
    Opis:
    The manufacturing and characterization of polymer nanocomposites is an active research trend nowadays. Nonetheless, statistical studies of polymer nanocomposites are not an easy task since they require several factors to consider, such as: large amount of samples manufactured from a standardized procedure and specialized equipment to address characterization tests in a repeatable fashion. In this manuscript, the experimental characterization of sensitivity, hysteresis error and drift error was carried out at multiple input voltages () for the following commercial brands of FSRs (force sensing resistors): Interlink FSR402 and Peratech SP200-10 sensors. The quotient between the mean and the standard deviation was used to determine dispersion in the aforementioned metrics. It was found that a low mean value in an error metric is typically accompanied by a comparatively larger dispersion, and similarly, a large mean value for a given metric resulted in lower dispersion; this observation was held for both sensor brands under the entire range of input voltages. In regard to sensitivity, both sensors showed similar dispersion in sensitivity for the whole range of input voltages. Sensors’ characterization was carried out in a tailored test bench capable of handling up to 16 sensors simultaneously; this let us speed up the characterization process.
    Źródło:
    Metrology and Measurement Systems; 2022, 29, 3; 469--481
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-5 z 5

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