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Wyświetlanie 1-5 z 5
Tytuł:
Application Of Bias Randomization In Evaluation Of Measuring Instrument Capability
Autorzy:
Fotowicz, P.
Powiązania:
https://bibliotekanauki.pl/articles/220973.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
measurement uncertainty
bias randomization
measuring instrument capability
Opis:
The paper deals with the problem of bias randomization in evaluation of the measuring instrument capability. The bias plays a significant role in assessment of the measuring instrument quality. Because the measurement uncertainty is a comfortable parameter for evaluation in metrology, the bias may be treated as a component of the uncertainty associated with the measuring instrument. The basic method for calculation of the uncertainty in modern metrology is propagation of distributions. Any component of the uncertainty budget should be expressed as a distribution. Usually, in the case of a systematic effect being a bias, the rectangular distribution is assumed. In the paper an alternative randomization method using the Flatten-Gaussian distribution is proposed.
Źródło:
Metrology and Measurement Systems; 2015, 22, 4; 513-520
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
A feedback weighted fusion algorithm with dynamic sensor bias correction for gyroscope array
Autorzy:
Yuan, Ding
Qin, Yongyuan
Shen, Xiaowei
Wu, Zongwei
Powiązania:
https://bibliotekanauki.pl/articles/1848956.pdf
Data publikacji:
2021
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
inertial sensor
gyroscope array
weighted fusion
bias correction
Opis:
Low-cost Micro-Electromechanical System (MEMS) gyroscopes are known to have a smaller size, lower weight, and less power consumption than their more technologically advanced counterparts. However, current low-grade MEMS gyroscopes have poor performance and cannot compete with quality sensors in high accuracy navigational and guidance applications. The main focus of this paper is to investigate performance improvements by fusing multiple homogeneous MEMS gyroscopes. These gyros are transformed into a virtual gyro using a feedback weighted fusion algorithm with dynamic sensor bias correction. The gyroscope array combines eight homogeneous gyroscope units on each axis and divides them into two layers of differential configuration. The algorithm uses the gyroscope array estimation value to remove the gyroscope bias and then correct the gyroscope array measurement value. Then the gyroscope variance is recalculated in real time according to the revised measurement value and the weighted coefficients and state estimation of each gyroscope are deduced according to the least square principle. The simulations and experiments showed that the proposed algorithm could further reduce the drift and improve the overall accuracy beyond the performance limitations of individual gyroscopes. The maximum cumulative angle error was -2.09 degrees after 2000 seconds in the static test, and the standard deviation (STD) of the output fusion value of the proposed algorithm was 0.006 degrees/s in the dynamic test, which was only 1.7% of the STD value of an individual gyroscope.
Źródło:
Metrology and Measurement Systems; 2021, 28, 1; 161-179
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Multiplicative method for reduction of bias in indirect digital measurement result
Autorzy:
Muravyov, S. V.
Zlygosteva, G. V.
Borikov, V. N.
Powiązania:
https://bibliotekanauki.pl/articles/221726.pdf
Data publikacji:
2011
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
bias
error reduction technique
shunt ohmic resistance
indirect measurement
Opis:
The error reduction technique, based on inverse transformation, for a shunt active resistance measurement using an ammeter and voltmeter is considered. When computing a corrected reading only multiplicative operations on two measurement results are used, namely squaring and division. The proposed method allows to increase resistance measurement accuracy by about two orders of magnitude what has been validated by both theoretical and experimental outcomes.
Źródło:
Metrology and Measurement Systems; 2011, 18, 3; 481-489
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Evaluation of Uncertainty of Phase Difference Determination in Presence of Bias
Autorzy:
Saranovac, L. V.
Vučijak, N. M.
Powiązania:
https://bibliotekanauki.pl/articles/221324.pdf
Data publikacji:
2016
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
sinusoidal electrical signals
phase difference
bias
uncertainty of measurement
MSAL algorithm
Opis:
Determination of the phase difference between two sinusoidal signals with noise components using samples of these signals is of interest in many measurement systems. The samples of signals are processed by one of many algorithms, such as 7PSF, UQDE and MSAL, to determine the phase difference. The phase difference result must be accompanied with estimation of the measurement uncertainty. The following issues are covered in this paper: the MSAL algorithm background, the ways of treating the bias influence on the phase difference result, comparison of results obtained by applying MSAL and the other mentioned algorithms to the same real signal samples, and evaluation of the uncertainty of the phase difference.
Źródło:
Metrology and Measurement Systems; 2016, 23, 4; 603-614
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
On the bias of terminal based gain and offset estimation using the ADC histogram test method
Autorzy:
Correa Alegria, F.
Tiglao, N. M. C.
Powiązania:
https://bibliotekanauki.pl/articles/221033.pdf
Data publikacji:
2011
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
analog to digital converter
histogram test method
estimator bias
terminal based
gain
offset
Opis:
The Histogram Test method is a popular technique in analog-to-digital converter (ADC) testing. The presence of additive noise in the test setup or in the ADC itself can potentially affect the accuracy of the test results. In this study, we demonstrate that additive noise causes a bias in the terminal based estimation of the gain but not in the estimation of the offset. The estimation error is determined analytically as a function of the sinusoidal stimulus signal amplitude and the noise standard deviation. We derive an exact but computationally difficult expression as well as a simpler closed form approximation that provides an upper bound of the bias of the terminal based gain. The estimators are validated numerically using a Monte Carlo procedure with simulated and experimental data.
Źródło:
Metrology and Measurement Systems; 2011, 18, 1; 3-12
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-5 z 5

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