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Wyszukujesz frazę "Zhou, S." wg kryterium: Autor


Wyświetlanie 1-4 z 4
Tytuł:
Reconstruction algorithm for obtaining the bending deformation of the base of heavy-duty machine tool using inverse Finite Element Method
Autorzy:
Liu, M.
Zhang, X.
Song, H.
Wang, J.
Zhou, S.
Powiązania:
https://bibliotekanauki.pl/articles/221566.pdf
Data publikacji:
2018
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
inverse Finite Element Method
bending deformation
heavy-duty machine tool
reconstruction algorithm
statically indeterminate structure
Opis:
The field of mechanical manufacturing is becoming more and more demanding on machining accuracy. It is essential to monitor and compensate the deformation of structural parts of a heavy-duty machine tool. The deformation of the base of a heavy-duty machine tool is an important factor that affects machining accuracy. The base is statically indeterminate and complex in load. It is difficult to reconstruct deformation by traditional methods. A reconstruction algorithm for determining bending deformation of the base of a heavy-duty machine tool using inverse Finite Element Method (iFEM) is presented. The base is equivalent to a multi-span beam which is divided into beam elements with support points as nodes. The deflection polynomial order of each element is analysed. According to the boundary conditions, the deformation compatibility conditions and the strain data measured by Fiber Bragg Grating (FBG), the deflection polynomial coefficients of a beam element are determined. Using the coordinate transformation, the deflection equation of the base is obtained. Both numerical verification and experiment were carried out. The deflection obtained by the reconstruction algorithm using iFEM and the actual deflection measured by laser displacement sensors were compared. The accuracy of the reconstruction algorithm is verified.
Źródło:
Metrology and Measurement Systems; 2018, 25, 4; 727-741
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
A novel fibre Bragg grating curvature sensor for structure deformation monitoring
Autorzy:
Liu, M.-Y.
Zhou, S.-G.
Song, H.
Zhou, W.-J.
Zhang, X.
Powiązania:
https://bibliotekanauki.pl/articles/221816.pdf
Data publikacji:
2018
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
fibre Bragg grating
curvature sensor
large structure parts
deformation monitoring
Opis:
Real-time monitoring of deformation of large structure parts is of great significance and the deformation of such structure parts is often accompanied with the change of curvature. The curvature can be obtained by measuring changes of strain, surface curve and modal displacement of the structure. However, many factors are faced with difficulty in measurement and low sensitivity at a small deformation level. In order to measure curvature in an effective way, a novel fibre Bragg grating (FBG) curvature sensor is proposed, which aims at removing the deficiencies of traditional methods in low precision and narrow adjusting. The sensor combines two FBGs with a specific structure of stainless steel elastomer. The elastomer can transfer the strain of the structure part to the FBG and then the FBG measures the strain to obtain the curvature. The performed simulation and experiment show that the sensor can effectively amplify the strain to the FBG through the unique structure of the elastomer, and the accuracy of the sensor used in the experiment is increased by 14% compared with that of the FBG used for direct measurement.
Źródło:
Metrology and Measurement Systems; 2018, 25, 3; 577-587
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Analysis Of Factors Affecting Gravity-Induced Deflection For Large And Thin Wafers In Flatness Measurement Using Three-Point-Support Method
Autorzy:
Liu, H.
Dong, Z.
Kang, R.
Zhou, P.
Gao, S.
Powiązania:
https://bibliotekanauki.pl/articles/220380.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
flatness measurement
large and thin silicon wafer
GID
three-point-support method
initial stress
Opis:
Accurate flatness measurement of silicon wafers is affected greatly by the gravity-induced deflection (GID) of the wafers, especially for large and thin wafers. The three-point-support method is a preferred method for the measurement, in which the GID uniquely determined by the positions of the supports could be calculated and subtracted. The accurate calculation of GID is affected by the initial stress of the wafer and the positioning errors of the supports. In this paper, a finite element model (FEM) including the effect of initial stress was developed to calculate GID. The influence of the initial stress of the wafer on GID calculation was investigated and verified by experiment. A systematic study of the effects of positioning errors of the support ball and the wafer on GID calculation was conducted. The results showed that the effect of the initial stress could not be neglected for ground wafers. The wafer positioning error and the circumferential error of the support were the most influential factors while the effect of the vertical positioning error was negligible in GID calculation.
Źródło:
Metrology and Measurement Systems; 2015, 22, 4; 531-546
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
A 128-channel high precision time measurement module
Autorzy:
Kang, L.
Zhao, L.
Zhou, J
Liu, S.
An, Q.
Powiązania:
https://bibliotekanauki.pl/articles/221564.pdf
Data publikacji:
2013
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
high precision
time measurement
PXI
data transfer
commissioning tests
Opis:
In the external target experiment for heavy ion collisions in the HIRFL-CSR, Multi-Wire Drift Chambers are used to measure the drift time of charged particles to obtain the track information. This 128-channel high precision time measurement module is designed to perform the time digitization. The data transfer is based on a PXI interface to guarantee a high data rate. Test results show that a 100 ps resolution with a data transfer rate up to 40 MBps has been achieved; this module has also been proven to function well with the detector through a commissioning test.
Źródło:
Metrology and Measurement Systems; 2013, 20, 2; 275-286
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-4 z 4

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