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Wyszukujesz frazę "Dong, Z." wg kryterium: Autor

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    Wyświetlanie 1-3 z 3
    Tytuł:
    Analysis Of Factors Affecting Gravity-Induced Deflection For Large And Thin Wafers In Flatness Measurement Using Three-Point-Support Method
    Autorzy:
    Liu, H.
    Dong, Z.
    Kang, R.
    Zhou, P.
    Gao, S.
    Powiązania:
    https://bibliotekanauki.pl/articles/220380.pdf
    Data publikacji:
    2015
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    flatness measurement
    large and thin silicon wafer
    GID
    three-point-support method
    initial stress
    Opis:
    Accurate flatness measurement of silicon wafers is affected greatly by the gravity-induced deflection (GID) of the wafers, especially for large and thin wafers. The three-point-support method is a preferred method for the measurement, in which the GID uniquely determined by the positions of the supports could be calculated and subtracted. The accurate calculation of GID is affected by the initial stress of the wafer and the positioning errors of the supports. In this paper, a finite element model (FEM) including the effect of initial stress was developed to calculate GID. The influence of the initial stress of the wafer on GID calculation was investigated and verified by experiment. A systematic study of the effects of positioning errors of the support ball and the wafer on GID calculation was conducted. The results showed that the effect of the initial stress could not be neglected for ground wafers. The wafer positioning error and the circumferential error of the support were the most influential factors while the effect of the vertical positioning error was negligible in GID calculation.
    Źródło:
    Metrology and Measurement Systems; 2015, 22, 4; 531-546
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    A novel method for 3D measurement of RFID multi-tag network using a machine vision system
    Autorzy:
    Zhuang, X.
    Yu, X.
    Zhao, Z.
    Zhang, W.
    Liu, Z.
    Lu, D.
    Dong, D.
    Powiązania:
    https://bibliotekanauki.pl/articles/221058.pdf
    Data publikacji:
    2018
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    3D measurement
    RFID multi-tag network
    dual-CCD system
    neural network
    machine vision
    Opis:
    The three-dimensional (3D) coordinate measurement of radio frequency identification (RFID) multi-tag networks is one of the important issues in the field of RFID, which affects the reading performance of RFID multi-tag networks. In this paper, a novel method for 3D coordinate measurement of RFID multi-tag networks is proposed. A dual-CCD system (vertical and horizontal cameras) is used to obtain images of RFID multi-tag networks from different angles. The iterative threshold segmentation and the morphological filtering method are used to process the images. The template matching method is respectively used to determine the two-dimensional (2D) coordinate and the vertical coordinate of each tag. After that, the 3D coordinate of each tag is obtained. Finally, a back-propagation (BP) neural network is used to model the nonlinear relationship between the RFID multi-tag network and the corresponding reading distance. The BP neural network can predict the reading distances of unknown tag groups and find out the optimal distribution structure of the tag groups corresponding to the maximum reading distance. In the future work, the corresponding in-depth research on the neural network to adjust the distribution of tags will be done.
    Źródło:
    Metrology and Measurement Systems; 2018, 25, 3; 475-486
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    An improved resonant thermal converter based on micro-bridge resonator
    Autorzy:
    Dong, L.
    Han, J.
    Zhang, P.
    Zhao, Z.
    Cheng, B.
    Han, D.
    Powiązania:
    https://bibliotekanauki.pl/articles/220878.pdf
    Data publikacji:
    2018
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    thermoelectric transfer difference
    micro-bridge resonator
    thermal converter
    bifilar heater
    Opis:
    This paper presents the design, fabrication and testing of an improved thin-film thermal converter based on an electro-thermally excited and piezo-resistively detected micro-bridge resonator. The resonant thermal converter comprises a bifilar heater and an opposing micro-bridge resonator. When the micro-bridge resonator absorbs the radiant heat from the heater, its axial strain changes, then its resonant frequency follows. Therefore the alternating voltage or current can be transferred to the equivalent DC quantity. A non-contact temperature sensing mechanism eliminates heat loss from thermopiles and reduces coupling capacitance between the temperature sensor and the heater compared with traditional thin-film thermal converters based on thermopiles. In addition, the quasi-digital output of the resonant thin-film thermal converter eliminates such problems as intensity fluctuations associated with analogue signals output by traditional thin-film thermal converters. Using the fast-reversed DC (FRDC) method, the thermoelectric transfer difference, which determines the frequency-independent part of the ac-dc transfer difference, is evaluated to be as low as 1.1 · 10-6. It indicates that the non-contact temperature sensing mechanism is a feasible method to develop a high-performance thermal converter.
    Źródło:
    Metrology and Measurement Systems; 2018, 25, 4; 715-725
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-3 z 3

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