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    Wyświetlanie 1-4 z 4
    Tytuł:
    Precision of the Sinefitting-Based Total Harmonic Distortion Estimator
    Autorzy:
    Alegria, F. C.
    Powiązania:
    https://bibliotekanauki.pl/articles/220913.pdf
    Data publikacji:
    2016
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    Total Harmonic Distortion
    noise
    sine wave fitting
    Opis:
    An analytical expression for the standard deviation of Total Harmonic Distortion (THD) estimation is derived. It applies to the case where the estimator uses sine fitting. It is shown that, in common circumstances, it is inversely proportional to the actual value of THD, the signal-to-noise ratio and the square root of the number of samples. The proposed expression is validated both with numerical simulations and an experimental setup using a Monte Carlo procedure.
    Źródło:
    Metrology and Measurement Systems; 2016, 23, 1; 37-46
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    On the Validity of the Noise Model of Quantization for the Frequency-Domain Amplitude Estimation of Low-Level Sine Waves
    Autorzy:
    Bellan, D.
    Powiązania:
    https://bibliotekanauki.pl/articles/221016.pdf
    Data publikacji:
    2015
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    quantization
    amplitude estimation
    sine wave
    discrete Fourier transform
    additive noise
    Opis:
    This paper deals with the amplitude estimation in the frequency domain of low-level sine waves, i.e. sine waves spanning a small number of quantization steps of an analog-to-digital converter. This is a quite common condition for high-speed low-resolution converters. A digitized sine wave is transformed into the frequency domain through the discrete Fourier transform. The error in the amplitude estimate is treated as a random variable since the offset and the phase of the sine wave are usually unknown. Therefore, the estimate is characterized by its standard deviation. The proposed model evaluates properly such a standard deviation by treating the quantization with a Fourier series approach. On the other hand, it is shown that the conventional noise model of quantization would lead to a large underestimation of the error standard deviation. The effects of measurement parameters, such as the number of samples and a kind of the time window, are also investigated. Finally, a threshold for the additive noise is provided as the boundary for validity of the two quantization models.
    Źródło:
    Metrology and Measurement Systems; 2015, 22, 1; 89-100
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Comparison of sine-wave frequency estimation methods in respect of speed and accuracy for a few observed cycles distorted by noise and harmonics
    Autorzy:
    Borkowski, J.
    Kania, D.
    Mroczka, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/220583.pdf
    Data publikacji:
    2018
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    DFT spectrum interpolation
    short-time frequency estimation
    statistical analysis
    Prony LS
    TLS
    ESPRIT
    Opis:
    The paper deals with frequency estimation methods of sine-wave signals for a few signal cycles and consists of two parts. The first part contains a short overview where analytical error formulae for a signal distorted by noise and harmonics are presented. These formulae are compared with other accurate equations presented previously by the authors which are even more accurate below one cycle in the measurement window. The second part contains a comparison of eight estimation methods (ESPRIT, TLS, Prony LS, a newly developed IpDFT method and four other 3-point IpDFT methods) in respect of calculation time and accuracy for an ideal sine-wave signal, signal distorted by AWGN noise and a signal distorted by harmonics. The number of signal cycles is limited from 0.1 to 3 or 5. The results enable to select the most accurate/fastest estimation method in various measurement conditions. Parametric methods are more accurate but also much slower than IpDFT methods (up to 3000 times for the number of samples equal to 5000). The presented method is more accurate than other IpDFT methods and much faster than parametric methods, which makes it possible to use it as an alternative, especially in real-time applications.
    Źródło:
    Metrology and Measurement Systems; 2018, 25, 2; 283-302
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    DAC testing using impulse signals
    Autorzy:
    Vedral, J.
    Fexa, P.
    Powiązania:
    https://bibliotekanauki.pl/articles/221597.pdf
    Data publikacji:
    2012
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    DAC
    ENOB
    SINAD
    FFT test
    Crest Factor
    Damped Sine Wave
    SINC signal
    Multi-Tone signal
    Opis:
    The Multi-Tone (MT) signal with uniform amplitudes can be used for DAC testing. This paper shows an easier way to generate a MT signal using several impulse signals. The article also analyzes qualities of methods for testing the dynamic parameters of Digital to Analog Converters using an impulse signal. The MT, Damped Sine Wave (DSW) and Sinx/x (SINC) signals will be used as the source for these tests. The Effective Number of Bits (ENOB) and Signal to noise and distortion (SINAD) are evaluated in the frequency domain and they are modified using the Crest Factor (CF) correction and compared with the standard results of the Sine Wave FFT test. The first advantage of the test using an impulse signal is that you need fewer input parameters to create the band signal for testing the DAC. The second one is to reduce the testing time using a band signal in comparison with multiple tests using a single sine wave.
    Źródło:
    Metrology and Measurement Systems; 2012, 19, 1; 105-114
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-4 z 4

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