- Tytuł:
- Wideband spectral emission measurements from laser-produced plasma EUV/SXR source based on a double gas puff target
- Autorzy:
-
Arikkatt, Antony Jose
Wachulak, Przemysław
Fiedorowicz, Henryk
Bartnik, Andrzej
Czwartos, Joanna - Powiązania:
- https://bibliotekanauki.pl/articles/1849155.pdf
- Data publikacji:
- 2020
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
Plasma Spectroscopy
X-ray coherence tomography
soft X-ray - Opis:
- We present spectral emission characteristics from laser-plasma EUV/SXR sources produced by irradiation of < 1 J energy laser pulse on eleven different double stream gas puff targets, with most intense electronic transitions identified in the spectral range from 1 nm to 70 nm wavelength which corresponds to photon energy from 18 eV to 1240 eV. The spectra were obtained using grazing incidence and transmission spectrographs from laser-produced plasma emission, formed by the interaction of a laser beam with a double stream gas puff target. Laser pulses with a duration of 4 ns and energy of 650 mJ were used for the experiment. We present the results obtained from three different spectrometers in the wavelength ranges of SXR (1-5.5 nm), SXR/EUV (4-15.5 nm), and EUV (10-70 nm). In this paper, detailed information about the source, gas targets under investigation, the experimental setup, spectral measurements and the results are presented and discussed. Such data may be useful for the identification of adequate spectral emissions from gasses in the EUV and SXR wavelength ranges dedicated to various experiments (i.e. broadband emission for the X-ray coherence tomography XCT) or may be used for verification of magnetohydrodynamic plasma codes.
- Źródło:
-
Metrology and Measurement Systems; 2020, 27, 4; 701-719
0860-8229 - Pojawia się w:
- Metrology and Measurement Systems
- Dostawca treści:
- Biblioteka Nauki