- Tytuł:
- Precise measurement of complex permittivity of materials for telecommunications devices
- Autorzy:
-
Nakamura, T.
Nikawa, Y. - Powiązania:
- https://bibliotekanauki.pl/articles/309568.pdf
- Data publikacji:
- 2001
- Wydawca:
- Instytut Łączności - Państwowy Instytut Badawczy
- Tematy:
-
perturbation method
TLM method
cavity resonator
simulation model
temperature dependence of complex permittivity
microwave measurement - Opis:
- In order to obtain precise complex permittivity of the dielectric materials obtained from the perturbation method a correction curve is made using the electromagnetic field simulator which applies transmission line modeling (TLM) method. In this experiment, generated microwave power with the frequency of 2.45 GHz is applied to heat dielectric material while measuring temperature dependence of complex permittivity of dielectric material. To obtain these objectives cavity resonator with cooling system is designed. It is found from the result that the accurate temperature dependence of complex permittivity of the materials can be obtained by the method presented here.
- Źródło:
-
Journal of Telecommunications and Information Technology; 2001, 3; 66-71
1509-4553
1899-8852 - Pojawia się w:
- Journal of Telecommunications and Information Technology
- Dostawca treści:
- Biblioteka Nauki
Artykuł